SLUSE36L July   2021  – September 2025 BQ77216

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 DC Characteristics
    6. 6.6 Timing Requirements
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Voltage Fault Detection
      2. 7.3.2 Open-Wire Fault Detection
      3. 7.3.3 Temperature Fault Detection
      4. 7.3.4 Oscillator Health Check
      5. 7.3.5 Sense Positive Input for Vx
      6. 7.3.6 Output Drive, COUT and DOUT
      7. 7.3.7 The LATCH Function
      8. 7.3.8 Supply Input, VDD
    4. 7.4 Device Functional Modes
      1. 7.4.1 NORMAL Mode
      2. 7.4.2 FAULT Mode
      3. 7.4.3 Customer Test Mode
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Design Requirements
      2. 8.1.2 Detailed Design Procedure
        1. 8.1.2.1 Cell Connection Sequence
    2. 8.2 Systems Example
  10. 9 Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Third-Party Products Disclaimer
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Support Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  13. 12Revision History
  14. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.2 Systems Example

In this application example, the choice of a FUSE or FETs is required on the COUT and DOUT pins—configured as an active-high drive to 6V outputs.

BQ77216 14-Series Cell Configuration with Active High 6V OptionFigure 8-3 14-Series Cell Configuration with Active High 6V Option

When pairing with the BQ769x2 or BQ76940 devices, the top cell must be used. For the BQ77216xx device to drive the CHG and DSG FETs, the active high 6V option is preferred. Its COUT and DOUT are controlling two N-CH FETs to jointly control the CHG and DSG FETs with the monitoring device. For such joint architecture, the open-wire feature of the BQ77216xx device may be affected if the primary protector or monitor device is actively measuring the cells. Care is needed to ensure the VOW spec of the BQ77216xx device is met or to choose a version of the BQ77216xx device with open wire disabled. When working with a BQ769x2 device, set the LOOP_SLOW to 0x11 to ensure the BQ77216xx VOW spec is met.

BQ77216 BQ77216 with BQ76952 Figure 8-4 BQ77216 with BQ76952