SLUSE36J July   2021  – November 2023 BQ77216

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Description (continued)
  6. 5 Device Comparison Table
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 DC Characteristics
    6. 7.6 Timing Requirements
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Voltage Fault Detection
      2. 8.3.2 Open-Wire Fault Detection
      3. 8.3.3 Temperature Fault Detection
      4. 8.3.4 Oscillator Health Check
      5. 8.3.5 Sense Positive Input for Vx
      6. 8.3.6 Output Drive, COUT and DOUT
      7. 8.3.7 The LATCH Function
      8. 8.3.8 Supply Input, VDD
    4. 8.4 Device Functional Modes
      1. 8.4.1 NORMAL Mode
      2. 8.4.2 FAULT Mode
      3. 8.4.3 Customer Test Mode
  10. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Design Requirements
      2. 9.1.2 Detailed Design Procedure
        1. 9.1.2.1 Cell Connection Sequence
    2. 9.2 Systems Example
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Third-Party Products Disclaimer
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  14. 13Revision History
  15. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.3.3 Temperature Fault Detection

In the BQ77216 device, the TS pin is ratiometrically monitored with an internal pullup resistance RNTC. Overtemperature is detected by evaluating the TS input voltage to determine the external resistance falls below a protection resistance, ROT_EXT. If the resistance falls below the programmed OT value, a timer circuit is activated. When the timer expires, the COUT and DOUT pins go from inactive to active state. The timer is reset if the resistance rises above the recovery threshold (ROT + ROT_HYS). Under temperature is detected by evaluating the TS input voltage to determine the external resistance falls below a protection resistance, RUT_EXT. If the resistance rises above the programmed UT value, a timer circuit is activated. When the timer expires, the COUT and DOUT pins go from inactive to active state. The timer is reset if the resistance falls below above the recovery threshold (ROT – ROT_HYS) If external capacitance is added to the TS pin, it needs to be within the spec limit shown in recommended operating conditions.

Note:

Texas Instruments does not recommend adding an external capacitor to the TS pin. The capacitance on this pin will affect the TS measurement accuracy if greater than CTS.