SCHS209D November   1998  – December 2024 CD74HC4067 , CD74HCT4067

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
    1. 4.1 Device Functional Modes
  6. 5 Absolute Maximum Ratings
  7. 6 Thermal Information
  8. 7 Recommended Operating Conditions
  9. 8 Electrical Characteristics: HC Devices
  10. 9 Electrical Characteristics: HCT Devices
  11. 10HTC Input Loading
  12. 11Switching Characteristics HC
  13. 12Switching Characteristics HCT
  14. 13Analog Channel Specifications
  15. 14Typical Characteristics
  16. 15Analog Test Circuits
  17. 16Device and Documentation Support
    1. 16.1 Related Documentation
    2. 16.2 Receiving Notification of Documentation Updates
    3. 16.3 Support Resources
    4. 16.4 Trademarks
    5. 16.5 Electrostatic Discharge Caution
    6. 16.6 Glossary
  18. 17Revision History
  19. 18Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • DGS|24
  • RGY|24
  • DW|24
  • DB|24
  • PW|24
Thermal pad, mechanical data (Package|Pins)
Orderable Information

15 Analog Test Circuits

CD74HC4067 CD74HCT4067 Frequency Response Test CircuitFigure 15-1 Frequency Response Test Circuit
CD74HC4067 CD74HCT4067 Control-to-Switch Feedthrough Noise Test CircuitFigure 15-3 Control-to-Switch Feedthrough Noise Test Circuit
CD74HC4067 CD74HCT4067 HC Transition Times and Propagation Delay Times, Combination LogicFigure 15-5 HC Transition Times and Propagation Delay Times, Combination Logic
CD74HC4067 CD74HCT4067 Sine Wave Distortion Test CircuitFigure 15-2 Sine Wave Distortion Test Circuit
CD74HC4067 CD74HCT4067 Switch Off Signal Feedthrough Test CircuitFigure 15-4 Switch Off Signal Feedthrough Test Circuit
CD74HC4067 CD74HCT4067 HCT Transition Times and Propagation Delay Times, Combination LogicFigure 15-6 HCT Transition Times and Propagation Delay Times, Combination Logic