SLLSFN1A
May 2021 – August 2026
ISOS141-SEP
PRODUCTION DATA
1
1
Features
2
Applications
3
Description
4
Pin Configuration and Functions
5
Specifications
5.1
Absolute Maximum Ratings
5.2
ESD Ratings
5.3
Recommended Operating Conditions
5.4
Thermal Information
5.5
Power Ratings
5.6
Insulation Specifications
5.7
Safety-Related Certifications
5.8
Safety Limiting Values
5.9
Electrical Characteristics—5-V Supply
5.10
Supply Current Characteristics—5-V Supply
5.11
Electrical Characteristics—3.3-V Supply
5.12
Supply Current Characteristics—3.3-V Supply
5.13
Electrical Characteristics—2.5-V Supply
5.14
Supply Current Characteristics—2.5-V Supply
5.15
Switching Characteristics—5-V Supply
5.16
Switching Characteristics—3.3-V Supply
5.17
Switching Characteristics—2.5-V Supply
5.18
Insulation Characteristics Curves
5.19
Typical Characteristics
6
Operating Life Deration
7
Parameter Measurement Information
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Radiation Tolerance
8.3.2
Electromagnetic Compatibility (EMC) Considerations
8.4
Device Functional Modes
8.4.1
Device I/O Schematics
9
Application and Implementation
9.1
Application Information
9.2
Typical Application
9.2.1
Design Requirements
9.2.2
Detailed Design Procedure
9.2.3
Application Curve
9.2.3.1
Insulation Lifetime
9.3
Power Supply Recommendations
9.4
Layout
9.4.1
Layout Guidelines
9.4.1.1
PCB Material
9.4.2
Layout Example
10
Device and Documentation Support
10.1
Documentation Support
10.1.1
Related Documentation
10.2
Receiving Notification of Documentation Updates
10.3
Support Resources
10.4
Trademarks
10.5
Electrostatic Discharge Caution
10.6
Glossary
11
Revision History
12
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
DBQ|16
MSOI004H
Thermal pad, mechanical data (Package|Pins)
Orderable Information
sllsfn1a_oa
sllsfn1a_pm
1
Features
Radiation Tolerant
Total Ionizing Dose (TID) Characterized (ELDRS-Free) = 30krad(Si)
TID RLAT/RHA = 30krad(Si)
Single-Event Latch-up (SEL) Immune to LET = 43MeV⋅cm
2
/mg at 125°C
Single-Event Dielectric Rupture (SEDR) Immune (43MeV⋅cm
2
/mg) at 500V
DC
Space Enhanced Plastic (Space EP)
Meets NASA’s ASTM E595 Outgassing Spec
Vendor Item Drawing (VID)
V62/21610
Military Temp Range (-55°C to 125°C)
One Wafer Fabrication Site
One Assembly and Test Site
Gold Bond Wire, NiPdAu Lead Finish
Wafer Lot Traceability
Extended Product Life Cycle
Extended Product Change Notification
600V
RMS
continuous working voltage
Safety-Related Certifications
:
DIN EN IEC 60747-17 (VDE 0884-17)
UL 1577 component recognition program
100Mbps data rate
Wide supply range: 2.25V to 5.5V
2.25V to 5.5V level translation
Default output
low
Low power consumption, 1.5mA per channel typical at 1Mbps
Low propagation delay: 10.7ns typical (5V Supplies)
Low channel-to-channel skew: 4ns max (5V Supplies)
±100kV/μs typical CMTI
System-level ESD, EFT, Surge, and Magnetic Immunity
Small QSOP (DBQ-16) package