SNIS159H August   1999  – December 2017 LM35

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: LM35A, LM35CA Limits
    6. 6.6 Electrical Characteristics: LM35A, LM35CA
    7. 6.7 Electrical Characteristics: LM35, LM35C, LM35D Limits
    8. 6.8 Electrical Characteristics: LM35, LM35C, LM35D
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 LM35 Transfer Function
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Capacitive Drive Capability
    2. 8.2 Typical Application
      1. 8.2.1 Basic Centigrade Temperature Sensor
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
    3. 8.3 System Examples
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Community Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • D|8
  • NDV|3
  • LP|3
  • NEB|3
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN MAX UNIT
Supply voltage –0.2 35 V
Output voltage –1 6 V
Output current 10 mA
Maximum Junction Temperature, TJmax 150 °C
Storage Temperature, Tstg TO-CAN, TO-92 Package –60 150 °C
TO-220, SOIC Package –65 150
(1) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and specifications.
(2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its rated operating conditions.

6.2 ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2500 V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
Specified operating temperature: TMIN to TMAX LM35, LM35A –55 150 °C
LM35C, LM35CA –40 110
LM35D 0 100
Supply Voltage (+VS) 4 30 V

6.4 Thermal Information

THERMAL METRIC(1)(2) LM35 UNIT
NDV LP D NEB
3 PINS 8 PINS 3 PINS
RθJA Junction-to-ambient thermal resistance 400 180 220 90 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 24 — — —
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) For additional thermal resistance information, see Typical Application.

6.5 Electrical Characteristics: LM35A, LM35CA Limits

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETER TEST CONDITIONS LM35A LM35CA UNIT
TYP TESTED LIMIT(2) DESIGN LIMIT(3) TYP TESTED LIMIT(2) DESIGN LIMIT(3)
Accuracy(4) TA = 25°C ±0.2 ±0.5 ±0.2 ±0.5 °C
TA = –10°C ±0.3 ±0.3 ±1
TA = TMAX ±0.4 ±1 ±0.4 ±1
TA = TMIN ±0.4 ±1 ±0.4 ±1.5
Nonlinearity(5) TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.18 ±0.35 ±0.15 ±0.3 °C
Sensor gain
(average slope)		 TMIN ≤ TA ≤ TMAX 10 9.9 10 9.9 mV/°C
–40°C ≤ TJ ≤ 125°C 10 10.1 10 10.1
Load regulation(1)
0 ≤ IL ≤ 1 mA		 TA = 25°C ±0.4 ±1 ±0.4 ±1 mV/mA
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.5 ±3 ±0.5 ±3
Line regulation(1) TA = 25°C ±0.01 ±0.05 ±0.01 ±0.05 mV/V
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 ±0.02 ±0.1 ±0.02 ±0.1
Quiescent current(6) VS = 5 V, 25°C 56 67 56 67 µA
VS = 5 V, –40°C ≤ TJ ≤ 125°C 105 131 91 114
VS = 30 V, 25°C 56.2 68 56.2 68
VS = 30 V, –40°C ≤ TJ ≤ 125°C 105.5 133 91.5 116
Change of quiescent current(1) 4 V ≤ VS ≤ 30 V, 25°C 0.2 1 0.2 1 µA
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 0.5 2 0.5 2
Temperature coefficient of quiescent current –40°C ≤ TJ ≤ 125°C 0.39 0.5 0.39 0.5 µA/°C
Minimum temperature for rate accuracy In circuit of Figure 14, IL = 0 1.5 2 1.5 2 °C
Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.

6.6 Electrical Characteristics: LM35A, LM35CA

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETER TEST CONDITIONS LM35A LM35CA UNIT
MIN TYP MAX TYP TYP MAX
Accuracy(4) TA = 25°C ±0.2 ±0.2 °C
Tested Limit(2) ±0.5 ±0.5
Design Limit(3)
TA = –10°C ±0.3 ±0.3
Tested Limit(2)
Design Limit(3) ±1
TA = TMAX ±0.4 ±0.4
Tested Limit(2) ±1 ±1
Design Limit(3)
TA = TMIN ±0.4 ±0.4
Tested Limit(2) ±1
Design Limit(3) ±1.5
Nonlinearity(5) TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.18 ±0.15 °C
Tested Limit(2)
Design Limit(3) ±0.35 ±0.3
Sensor gain
(average slope)		 TMIN ≤ TA ≤ TMAX 10 10 mV/°C
Tested Limit(2) 9.9
Design Limit(3) 9.9
–40°C ≤ TJ ≤ 125°C 10 10
Tested Limit(2) 10.1
Design Limit(3) 10.1
Load regulation(1)
0 ≤ IL ≤ 1 mA		 TA = 25°C ±0.4 ±0.4 mV/mA
Tested Limit(2) ±1 ±1
Design Limit(3)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.5 ±0.5
Tested Limit(2)
Design Limit(3) ±3 ±3
Line regulation(1) TA = 25°C ±0.01 ±0.01 mV/V
Tested Limit(2) ±0.05 ±0.05
Design Limit(3)
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 ±0.02 ±0.02
Tested Limit(2)
Design Limit(3) ±0.1 ±0.1
Quiescent current(6) VS = 5 V, 25°C 56 56 µA
Tested Limit(2) 67 67
Design Limit(3)
VS = 5 V,
–40°C ≤ TJ ≤ 125°C		 105 91
Tested Limit(2)
Design Limit(3) 131 114
VS = 30 V, 25°C 56.2 56.2
Tested Limit(2) 68 68
Design Limit(3)
VS = 30 V,
–40°C ≤ TJ ≤ 125°C		 105.5 91.5
Tested Limit(2)
Design Limit(3) 133 116
Change of quiescent current(1) 4 V ≤ VS ≤ 30 V, 25°C 0.2 0.2 µA
Tested Limit(2) 1 1
Design Limit(3)
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 0.5 0.5
Tested Limit(2)
Design Limit(3) 2 2
Temperature coefficient of quiescent current –40°C ≤ TJ ≤ 125°C 0.39 0.39 µA/°C
Tested Limit(2)
Design Limit(3) 0.5 0.5
Minimum temperature for rate accuracy In circuit of Figure 14, IL = 0 1.5 1.5 °C
Tested Limit(2)
Design Limit(3) 2 2
Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.

6.7 Electrical Characteristics: LM35, LM35C, LM35D Limits

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETER TEST CONDITIONS LM35 LM35C, LM35D UNIT
TYP TESTED LIMIT(2) DESIGN LIMIT(3) TYP TESTED LIMIT(2) DESIGN LIMIT(3)
Accuracy, LM35, LM35C(4) TA = 25°C ±0.4 ±1 ±0.4 ±1 °C
TA = –10°C ±0.5 ±0.5 ±1.5
TA = TMAX ±0.8 ±1.5 ±0.8 ±1.5
TA = TMIN ±0.8 ±1.5 ±0.8 ±2
Accuracy, LM35D(4) TA = 25°C ±0.6 ±1.5 °C
TA = TMAX ±0.9 ±2
TA = TMIN ±0.9 ±2
Nonlinearity(4) TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.3 ±0.5 ±0.2 ±0.5 °C
Sensor gain
(average slope)		 TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 10 9.8 10 9.8 mV/°C
10 10.2 10 10.2
Load regulation(1)
0 ≤ IL ≤ 1 mA		 TA = 25°C ±0.4 ±2 ±0.4 ±2 mV/mA
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.5 ±5 ±0.5 ±5
Line regulation(1) TA = 25°C ±0.01 ±0.1 ±0.01 ±0.1 mV/V
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 ±0.02 ±0.2 ±0.02 ±0.2
Quiescent current(5) VS = 5 V, 25°C 56 80 56 80 µA
VS = 5 V, –40°C ≤ TJ ≤ 125°C 105 158 91 138
VS = 30 V, 25°C 56.2 82 56.2 82
VS = 30 V, –40°C ≤ TJ ≤ 125°C 105.5 161 91.5 141
Change of quiescent current(1) 4 V ≤ VS ≤ 30 V, 25°C 0.2 2 0.2 2 µA
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 0.5 3 0.5 3
Temperature coefficient of quiescent current –40°C ≤ TJ ≤ 125°C 0.39 0.7 0.39 0.7 µA/°C
Minimum temperature for rate accuracy In circuit of Figure 14, IL = 0 1.5 2 1.5 2 °C
Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(5) Quiescent current is defined in the circuit of Figure 14.

6.8 Electrical Characteristics: LM35, LM35C, LM35D

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETER TEST CONDITIONS LM35 LM35C, LM35D UNIT
MIN TYP MAX MIN TYP MAX
Accuracy, LM35, LM35C(4) TA = 25°C ±0.4 ±0.4 °C
Tested Limit(2) ±1 ±1
Design Limit(3)
TA = –10°C ±0.5 ±0.5
Tested Limit(2)
Design Limit(3) ±1.5
TA = TMAX ±0.8 ±0.8
Tested Limit(2) ±1.5
Design Limit(3) ±1.5
TA = TMIN ±0.8 ±0.8
Tested Limit(2)
Design Limit(3) ±1.5 ±2
Accuracy, LM35D(4) TA = 25°C ±0.6 °C
Tested Limit(2) ±1.5
Design Limit(3)
TA = TMAX ±0.9
Tested Limit(2)
Design Limit(3) ±2
TA = TMIN ±0.9
Tested Limit(2)
Design Limit(3) ±2
Nonlinearity(5) TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.3 ±0.2 °C
Tested Limit(2)
Design Limit(3) ±0.5 ±0.5
Sensor gain
(average slope)		 TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 10 10 mV/°C
Tested Limit(2) 9.8
Design Limit(3) 9.8
10 10
Tested Limit(2) 10.2
Design Limit(3) 10.2
Load regulation(1)
0 ≤ IL ≤ 1 mA		 TA = 25°C ±0.4 ±0.4 mV/mA
Tested Limit(2) ±2 ±2
Design Limit(3)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.5 ±0.5
Tested Limit(2)
Design Limit(3) ±5 ±5
Line regulation(1) TA = 25°C ±0.01 ±0.01 mV/V
Tested Limit(2) ±0.1
Design Limit(3) ±0.1
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 ±0.02 ±0.02
Tested Limit(2)
Design Limit(3) ±0.2 ±0.2
Quiescent current(6) VS = 5 V, 25°C 56 56 µA
Tested Limit(2) 80 80
Design Limit(3)
VS = 5 V, –40°C ≤ TJ ≤ 125°C 105 91
Tested Limit(2)
Design Limit(3) 158 138
VS = 30 V, 25°C 56.2 56.2
Tested Limit(2) 82 82
Design Limit(3)
VS = 30 V,
–40°C ≤ TJ ≤ 125°C		 105.5 91.5
Tested Limit(2)
Design Limit(3) 161 141
Change of quiescent current(1) 4 V ≤ VS ≤ 30 V, 25°C 0.2 0.2 µA
Tested Limit(2) 2
Design Limit(3) 2
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 0.5 0.5
Tested Limit(2)
Design Limit(3) 3 3
Temperature coefficient of quiescent current –40°C ≤ TJ ≤ 125°C 0.39 0.39 µA/°C
Tested Limit(2)
Design Limit(3) 0.7 0.7
Minimum temperature for rate accuracy In circuit of Figure 14, IL = 0 1.5 1.5 °C
Tested Limit(2)
Design Limit(3) 2 2
Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.

6.9 Typical Characteristics

LM35 C001_SNIS159.png Figure 1. Thermal Resistance Junction To Air
LM35 C003_SNIS159.png Figure 3. Thermal Response In Still Air
LM35 C005_SNIS159.png Figure 5. Minimum Supply Voltage vs Temperature
LM35 C007_SNIS159.png Figure 7. Quiescent Current vs Temperature (in Circuit of Full-Range Centigrade Temperature Sensor)
LM35 C009_SNIS159.png Figure 9. Accuracy vs Temperature (Ensured)
LM35 C011_SNIS159.png Figure 11. Start-Up Response
LM35 C002_SNIS159.png Figure 2. Thermal Time Constant
LM35 C004_SNIS159.png Figure 4. Thermal Response In Stirred Oil Bath
LM35 C006_SNIS159.png Figure 6. Quiescent Current vs Temperature (in Circuit of Figure 14)
LM35 C008_SNIS159.png Figure 8. Accuracy vs Temperature (Ensured)
LM35 C010_SNIS159.png Figure 10. Noise Voltage