SNAS718C December 2016 – December 2017 LMK60E0-156M , LMK60E0-212M , LMK60E2-100M , LMK60E2-125M , LMK60E2-156M , LMK60I2-100M , LMK60I2-322M
PRODUCTION DATA.
- 1 Features
- 2 Applications
- 3 Description
- 4 Revision History
- 5 Pin Configuration and Functions
-
6 Specifications
- 6.1 Absolute Maximum Ratings
- 6.2 ESD Ratings
- 6.3 Recommended Operating Conditions
- 6.4 Thermal Information
- 6.5 Electrical Characteristics - Power Supply
- 6.6 LVPECL Output Characteristics
- 6.7 LVDS Output Characteristics
- 6.8 HCSL Output Characteristics
- 6.9 OE Input Characteristics
- 6.10 Frequency Tolerance Characteristics
- 6.11 Power-On/Reset Characteristics (VDD)
- 6.12 PSRR Characteristics
- 6.13 PLL Clock Output Jitter Characteristics
- 6.14 Additional Reliability and Qualification
- 7 Parameter Measurement Information
- 8 Power Supply Recommendations
- 9 Layout
- 10Device and Documentation Support
- 11Mechanical, Packaging, and Orderable Information
Package Options
Refer to the PDF data sheet for device specific package drawings
Mechanical Data (Package|Pins)
- SIA|6
Thermal pad, mechanical data (Package|Pins)
Orderable Information
7 Parameter Measurement Information
7.1 Device Output Configurations
Figure 1. LVPECL Output DC Configuration During Device Test
Figure 2. LVDS Output DC Configuration During Device Test
Figure 3. HCSL Output DC Configuration During Device Test Also compatible with 85 Ω termination
1. Also compatible with 85 Ω termination
Figure 4. LVPECL Output AC Configuration During Device Test
Figure 5. LVDS Output AC Configuration During Device Test
Figure 6. HCSL Output AC Configuration During Device Test
Figure 7. PSRR Test Setup
Figure 8. Differential Output Voltage and Rise/Fall Time