7 Revision History
Changes from Revision C (February 2002) to Revision D (October 2026)
- Updated the numbering format for tables, figures, and cross-references throughout
the documentGo
- Added Applications sectionGo
- Updated Package Information table in Description
sectionGo
- Deleted DB package information from datasheetGo
- Deleted Schematic sectionGo
- Added Pin Configuration and Functions section and Pin Functions
tableGo
- Added ESD Ratings sectionGo
- Changed Input offset voltage for 25°C typical from 2mV to
0.6mVGo
- Changed Input offset current for 25°C typical from 30nA to
0.5nAGo
- Changed Temperature coefficient of input offset voltage typical from
10μV/°C to 7μV/°CGo
- Changed Temperature coefficient of input offset current typical from
50pA/°C to 10pA/°CGo
- Changed Input bias current for 25°C typical from –0.2μA to
–0.01μAGo
- Changed Peak output voltage swing for RL = 10kΩ typical
from 12.5V to 12.6V for MC3303Go
- Changed Peak output voltage swing for RL = 10kΩ typical
from ±13.5V to ±13.6V for MC3403Go
- Changed Peak output voltage swing for RL = 2kΩ typical
from 12V to 12.5V for MC3303Go
- Changed Peak output voltage swing for RL = 2kΩ typical
from ±13V to ±13.5V for MC3403Go
- Changed Large-signal differential voltage amplification test
condition from RL = 2kΩ to 10kΩ and typical from 200V/mV to
100V/mVGo
- Deleted Maximum-output-swing bandwidthGo
- Changed Phase margin test conditions from CL= 200pF to
20pF and from RL= 2kΩ to 10MΩGo
- Changed Phase margin typical from 60° to 56°Go
- Deleted Input resistance test condition and changed typical from 1MΩ
to 10MΩGo
- Deleted Output resistance test condition and changed typical from
75Ω to 300ΩGo
- Changed Common-mode rejection ratio typical from 90dB to
80dBGo
- Changed Supply voltage sensitivity typical from 30µV/V to 10µV/V and
maximum from 150µV/V to 562µV/VGo
- Changed Short-circuit output current typical from ±30mA to ±40mA and
deleted maximumGo
- Changed Total supply current typical from 2.8mA to
0.24mAGo
- Added Crosstalk attenuationGo
- Changed Input offset voltage typical from 2mV to
0.6mVGo
- Changed Input offset current typical from 30nA to
0.5nAGo
- Changed Input bias current typical from –0.2µA to
–0.01µAGo
- Changed Peak output voltage swing, RL = 10kΩ typical
from 3.5V to 3.65VGo
- Deleted Large-signal differential voltage amplification minimum and
changed typical from 200V/mV to 100v/mVGo
- Changed Supply-voltage sensitivity maximum from 150µV/V to
562µV/VGo
- Changed Supply current typical from 2.5mA to
0.240mAGo
- Changed Slew rate at unity gain test conditions CL from
100pF to 30pF and RL from 2kΩ to 1MΩ and deleted See Figure 1 and
changed typical from 0.6V/µs to 0.5V/µsGo
- Changed Rise time test conditions CL from 100pF to 30pF
and RL from 10kΩ to 1MΩ and deleted See Figure 1Go
- Changed Fall time test conditions CL from 100pF to 30pF
and RL from 10kΩ to 1MΩ and deleted See Figure 1Go
- Changed Overshoot factor test conditions CL from 100pF to
30pF and RL from 10kΩ to 1MΩ and deleted See Figure 1 and typical
from 20% to 12%Go
- Deleted Crossover distortion rowGo
- Deleted Parameter Measurement Information
sectionGo
- Added Legacy Die to existing figure titles and added new die
figures in Typical Characteristics sectionGo
- Added Legacy Versus New Die Comparison
sectionGo