SLAS272H July 2000 – May 2018 MSP430F133 , MSP430F135 , MSP430F147 , MSP430F1471 , MSP430F148 , MSP430F1481 , MSP430F149 , MSP430F1491
PRODUCTION DATA.
| PARAMETER | TEST CONDITIONS | VCC | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|---|
| EI | Integral linearity error | 1.4 V ≤ (VVeREF+ – VVREF-/VeREF-)min ≤ 1.6 V | 2.2 V, 3 V | ±2 | LSB | ||
| 1.6 V < (VVeREF+ – VVREF-/VeREF-)min ≤ VAVCC | ±1.7 | ||||||
| ED | Differential linearity error | (VVeREF+ – VVREF-/VeREF-)min ≤ (VVeREF+ – VVREF-/VeREF-),
CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±1 | LSB | ||
| EO | Offset error | (VVeREF+ – VVREF-/VeREF-)min ≤ (VVeREF+ – VVREF-/VeREF-),
Internal impedance of source RS< 100 Ω, CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±2 | ±4 | LSB | |
| EG | Gain error | (VVeREF+ – VVREF-/VeREF-)min ≤ (VVeREF+ – VVREF-/VeREF-),
CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±1.1 | ±2 | LSB | |
| ET | Total unadjusted error | (VVeREF+ – VVREF-/VeREF-)min ≤ (VVeREF+ – VVREF-/VeREF-),
CVREF+ = 10 µF (tantalum) and 100 nF (ceramic) |
2.2 V, 3 V | ±2 | ±5 | LSB | |