SBVS058D June   2005  – April 2026 REF3212 , REF3220 , REF3225 , REF3230 , REF3233 , REF3240

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Electrical Characteristics
    4. 5.4 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
      1. 6.1.1 Supply Voltage
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Thermal Hysteresis
      2. 6.3.2 Temperature Drift
      3. 6.3.3 Noise Performance
      4. 6.3.4 Load Regulation
    4. 6.4 Device Functional Modes
      1. 6.4.1 Shutdown
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Long-Term Stability
    2. 7.2 Typical Application
      1. 7.2.1 Detailed Design Procedure
        1. 7.2.1.1 Negative Reference Voltage
        2. 7.2.1.2 Data Acquisition
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.1 Absolute Maximum Ratings

Over operating free-air temperature range (unless otherwise noted).(1)
REF32xx UNIT
Input voltage +7.5 V
Output short-circuit Continuous
Operating temperature –55 to +135 °C
Storage temperature –65 to +150 °C
Junction temperature +150 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.