SLLS351F April 2002 – July 2021 SN65C3221 , SN75C3221
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. | |
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |