SBOS832A July 2017 – August 2017 TLV07
PRODUCTION DATA.
| MIN | MAX | UNIT | |
|---|---|---|---|
| Supply voltage | –20 | 20 | V |
| Single supply voltage | 40 | V | |
| Signal input pin voltage | (V–) – 0.5 | (V+) + 0.5 | V |
| Signal input pin current | –10 | 10 | mA |
| Output short-circuit current(2) | Continuous | ||
| Operating ambient temperature, TA | –40 | 125 | °C |
| Junction temperature, TJ | 150 | °C | |
| Storage temperature, Tstg | –65 | 150 | °C |
| VALUE | UNIT | |||
|---|---|---|---|---|
| V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
| Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±500 | |||
| MIN | MAX | UNIT | ||
|---|---|---|---|---|
| VS | Supply voltage (VS = V+ – V–) | 2.7 | 36 | V |
| TA | Operating temperature | –40 | 125 | °C |
| THERMAL METRIC | TLV07 | UNIT | |
|---|---|---|---|
| D (SOIC) | |||
| 8 PINS | |||
| RθJA | Junction-to-ambient thermal resistance | 149.5 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 97.9 | °C/W |
| RθJB | Junction-to-board thermal resistance | 87.7 | °C/W |
| ψJT | Junction-to-top characterization parameter | 35.5 | °C/W |
| ψJB | Junction-to-board characterization parameter | 89.5 | °C/W |
| RθJC(bot) | Junction-to-case (bottom) thermal resistance | — | °C/W |
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| OFFSET VOLTAGE | ||||||
| VOS | Input offset voltage | 50 | ±100 | µV | ||
| dVOS/dT | Input offset voltage drift | TA = –40°C to 125°C | ±0.9 | µV/°C | ||
| PSRR | Input offset voltage vs power supply | VS = 2.7 V to 36 V | 0.3 | µV/V | ||
| INPUT BIAS CURRENT | ||||||
| IB | Input bias current | ±40 | pA | |||
| TA = –40°C to 125°C | ±3 | nA | ||||
| IOS | Input offset current | ±4 | pA | |||
| NOISE | ||||||
| Input voltage noise | ƒ = 0.1 Hz to 10 Hz | 2.7 | µVPP | |||
| en | Input voltage noise density | ƒ = 1 kHz | 19 | nV/√Hz | ||
| INPUT VOLTAGE | ||||||
| VCM | Common-mode voltage range | (V–) – 0.1 | (V+) – 2 | V | ||
| CMRR | Common-mode rejection ratio | VS = ±18 V, (V–) - 0.1 V < VCM < (V+) – 2 V | 104 | 120 | dB | |
| INPUT IMPEDANCE | ||||||
| Differential | 100 || 3 | MΩ || pF | ||||
| Common-mode | 6 || 3 | 1012 Ω || pF | ||||
| OPEN-LOOP GAIN | ||||||
| AOL | Open-loop voltage gain | (V–) + 0.35 V < VO < (V+) – 0.35 V | 110 | 130 | dB | |
| FREQUENCY RESPONSE | ||||||
| GBP | Gain bandwidth product | 1 | MHz | |||
| SR | Slew rate | G = 1 | 0.4 | V/µs | ||
| tS | Settling time | To 0.1%, VS = ±18 V, G = +1, 10-V step | 20 | µs | ||
| To 0.01% (12-bit), VS = ±18 V G = 1 10-V step |
28 | µs | ||||
| OUTPUT | ||||||
| VO | Voltage output swing from rail | RL = 10 kΩ | 120 | mV | ||
| ISC | Short-circuit current | 17 | mA | |||
| RO | Open-loop output resistance | ƒ = 1 MHz IO = 0 A |
900 | Ω | ||
| POWER SUPPLY | ||||||
| IQ | Quiescent current per amplifier | IO = 0 A | 930 | 1800 | µA | |
| TEMPERATURE | ||||||
| Specified range | –40 | 125 | °C | |||
| Operating range | –40 | 125 | °C | |||
| DESCRIPTION | FIGURE |
|---|---|
| Offset Voltage Production Distribution | Figure 1 |
| Offset Voltage Drift Distribution | Figure 2 |
| Offset Voltage vs Temperature | Figure 3 |
| Offset Voltage vs Common-Mode Voltage | Figure 4 |
| Offset Voltage vs Power Supply | Figure 5 |
| IB and IOS vs Common-Mode Voltage | Figure 6 |
| Input Bias Current vs Temperature | Figure 7 |
| Output Voltage Swing vs Output Current (Maximum Supply) | Figure 8 |
| CMRR and PSRR vs Frequency (Referred-to-Input) | Figure 9 |
| CMRR vs Temperature | Figure 10 |
| PSRR vs Temperature | Figure 11 |
| 0.1-Hz to 10-Hz Noise | Figure 12 |
| Input Voltage Noise Spectral Density vs Frequency | Figure 13 |
| THD+N Ratio vs Frequency | Figure 14 |
| THD+N vs Output Amplitude | Figure 15 |
| Quiescent Current vs Temperature | Figure 16 |
| Quiescent Current vs Supply Voltage | Figure 17 |
| Open-Loop Gain and Phase vs Frequency | Figure 18 |
| Closed-Loop Gain vs Frequency | Figure 19 |
| Open-Loop Gain vs Temperature | Figure 20 |
| Open-Loop Output Impedance vs Frequency | Figure 21 |
| No Phase Reversal | Figure 22 |
| Positive Overload Recovery | Figure 23 |
| Negative Overload Recovery | Figure 24 |
| Small-Signal Step Response | Figure 25, Figure 26 |
| Large-Signal Step Response | Figure 27, Figure 28 |
| Large-Signal Settling Time | Figure 29 |
| Short-Circuit Current vs Temperature | Figure 30 |
| Maximum Output Voltage vs Frequency | Figure 31 |
| EMIRR IN+ vs Frequency | Figure 32 |
Figure 1. Input Offset Voltage Distribution
Figure 3. Input Offset Voltage vs Temperature
Figure 5. Offset Voltage vs Power Supply
Figure 7. Input Bias Current vs Temperature
Figure 9. CMRR and PSRR vs Frequency
Figure 11. PSRR vs Temperature
Figure 13. Input Voltage Noise Spectral Density vs Frequency
Figure 15. THD + N vs Output Amplitude
Figure 17. Quiescent Current vs Supply Voltage
Figure 19. Closed-Loop Gain vs Frequency
Figure 21. Open-Loop Output Impedance vs Frequency
Figure 23. Positive Overload Recovery
| G = +1 V/V |
| G = +1 V/V |
| 10-V positive step |
Figure 31. Maximum Output Voltage vs Frequency
Figure 2. Input Offset Voltage Drift Distribution
Figure 4. Input Offset Voltage vs Common-Mode Voltage
Figure 6. IB and IOS vs Common Mode Voltage
Figure 8. Output Voltage Swing vs Output Current (Maximum Supply)
Figure 10. CMRR vs Temperature
Figure 12. 0.1-Hz to 10-Hz Noise
Figure 14. THD + N Ratio vs Frequency
Figure 16. Quiescent Current vs Temperature
Figure 18. Open-Loop Gain and Phase vs Frequency
Figure 20. Open-Loop Gain vs Temperature
Figure 22. No Phase Reversal
Figure 24. Negative Overload Recovery
| G = –1 V/V |
| G = –1 V/V |
Figure 32. EMIRR IN+ vs Frequency