SBOSAF6B June 2024 – July 2025 TMCS1127
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | VALUE | UNIT | ||
|---|---|---|---|---|---|
| GENERAL | |||||
| CLR | External clearance(1) | Shortest terminal-to-terminal distance through air | ≥ 8 | mm | |
| CPG | External creepage(1) | Shortest terminal-to-terminal distance across the package surface | ≥ 8 | mm | |
| CTI | Comparative tracking index | DIN EN 60112; IEC 60112 | ≥ 600 | V | |
| Material group | According to IEC 60664-1 | I | |||
| Overvoltage category per IEC 60664-1 | Rated mains voltage ≤ 600VRMS | I-IV | |||
| VIORM | Maximum repetitive peak isolation voltage | AC voltage (bipolar) | 1697 | VPK | |
| VIOWM | Maximum reinforced isolation working voltage | AC voltage (sine wave); Time Dependent Dielectric Breakdown (TDDB) test, < 1ppm fail rate, see Input Isolation section. | 950 | VRMS | |
| 1343 | VDC | ||||
| Maximum basic isolation working voltage | AC voltage (sine wave); Time Dependent Dielectric Breakdown (TDDB) test, < 1000ppm fail rate, see Input Isolation section. | 1200 | VRMS | ||
| 1697 | VDC | ||||
| VIOTM | Maximum transient isolation voltage | VTEST = √2 x VISO, t = 60s (qualification); VTEST = 1.2 × VIOTM, t = 1s (100% production) |
7071 | VPK | |
| VIOSM | Maximum surge isolation voltage(2) | Test method per IEC 62368-1, 1.2/50µs waveform, VTEST = 1.3 × VIOSM (qualification) |
10000 | VPK | |
| qpd | Apparent charge(3) | Method b1: At routine test (100% production) and preconditioning (type test), Vini = 1.2 x VIOTM, tini = 1s, Vpd(m) = 1.875 × VIORM, tm = 1s | ≤5 | pC | |
| CIO | Barrier capacitance, input to output(4) | VIO = 0.4 sin (2πft), f = 1MHz | 0.6 | pF | |
| RIO | Isolation resistance, input to output(4) | VIO = 500V, TA = 25°C | >1012 | Ω | |
| VIO = 500V, 100°C ≤ TA ≤ 125°C | >1011 | Ω | |||
| VIO = 500V at TS = 150°C | >109 | Ω | |||
| Pollution degree | 2 | ||||
| UL 1577 | |||||
| VISO | Withstand isolation voltage | VTEST = VISO, t = 60s (qualification); VTEST = 1.2 × VISO, t = 1s (100% production) |
5000 | VRMS | |