SNAS651A January   2015  – September 2018 TPL5010

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      Simplified Application Schematic
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Ratings
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 WAKE
      2. 8.3.2 DONE
      3. 8.3.3 RSTn
    4. 8.4 Device Functional Modes
      1. 8.4.1 Start-Up
      2. 8.4.2 Normal Operating Mode
    5. 8.5 Programming
      1. 8.5.1 Configuring the WAKE Interval With the DELAY/M_RST Pin
      2. 8.5.2 Manual Reset
        1. 8.5.2.1 DELAY/M_RST
        2. 8.5.2.2 Circuitry
      3. 8.5.3 Timer Interval Selection Using External Resistance
      4. 8.5.4 Quantization Error
      5. 8.5.5 Error Due to Real External Resistance
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Receiving Notification of Documentation Updates
    2. 12.2 Community Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.5 Electrical Characteristics(1)

Specifications are for TA= 25°C, VDD-GND = 2.5 V, unless otherwise stated.
PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT
POWER SUPPLY
IDD Supply current(4) Operation mode 35 50 nA
Digital conversion of external resistance (Rext) 200 400 µA
TIMER
tIP Time Interval Period 1650 selectable Time Intervals Minimum time interval 100 ms
Maximum time interval 7200 s
Time Interval Setting Accuracy(7) Excluding the precision of Rext ±0.6%
Timer Interval Setting Accuracy over supply voltage 1.8 V ≤ VDD ≤ 5.5 V ±25 ppm/V
tOSC Oscillator Accuracy –0.5% 0.5%
Oscillator Accuracy over temperature(5) –40°C ≤ TA ≤ 105°C ±100 ±400 ppm/°C
Oscillator Accuracy over supply voltage 1.8 V ≤ VDD ≤ 5.5 V ±0.4 %/V
Oscillator Accuracy over life time(6) 0.24%
tDONE DONE Pulse width (5) 100 ns
tRSTn RSTn Pulse width 320 ms
tWAKE WAKE Pulse width 20 ms
t_Rext Time to convert Rext 100 120 ms
DIGITAL LOGIC LEVELS
VIH Logic High Threshold DONE pin 0.7 × VDD V
VIL Logic Low Threshold DONE pin 0.3 × VDD V
VOH Logic output High Level WAKE pin Iout = 100 µA VDD – 0.3 V
Iout = 1 mA VDD – 0.7 V
VOL Logic output Low Level WAKE pin Iout = -100 µA 0.3 V
Iout = –1 mA 0.7 V
VOLRSTn RSTn Logic output Low Level IOL = –1 mA 0.3 V
IOHRSTn RSTn High Level output current VOHRSTn = VDD 1 nA
VIHM_RST Logic High Threshold DELAY/M_RST pin 1.5 V
(1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically.
(2) Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through correlations using statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material.
(4) The supply current excludes load and pullup resistor current. Input pins are at GND or VDD.
(5) This parameter is specified by design and/or characterization and is not tested in production.
(6) Operational life time test procedure equivalent to 10 years.
(7) The accuracy for time interval settings below 1 second is ±100 ms.