SLVSF21D August   2019  – August 2020 TPS23882

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Device Comparison Table
  6. Pin Configuration and Functions
    1.     Pin Functions
    2. 6.1 Detailed Pin Description
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Typical Characteristics
  8. Parameter Measurement Information
    1. 8.1 Timing Diagrams
  9. Detailed Description
    1. 9.1 Overview
      1. 9.1.1 Operating Modes
        1. 9.1.1.1 Auto
        2. 9.1.1.2 Semiauto
        3. 9.1.1.3 Manual/Diagnostic
        4. 9.1.1.4 Power Off
      2. 9.1.2 PoE Compliance Terminology
      3. 9.1.3 PoE 2 Type-3 2-Pair PoE
      4. 9.1.4 Requested Class versus Assigned Class
      5. 9.1.5 Power Allocation and Power Demotion
      6. 9.1.6 Programmable SRAM
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Port Remapping
      2. 9.3.2 Port Power Priority
      3. 9.3.3 Analog-to-Digital Converters (ADC)
      4. 9.3.4 I2C Watchdog
      5. 9.3.5 Current Foldback Protection
    4. 9.4 Device Functional Modes
      1. 9.4.1 Detection
      2. 9.4.2 Classification
      3. 9.4.3 DC Disconnect
      4.      41
    5. 9.5 I2C Programming
      1. 9.5.1 I2C Serial Interface
    6. 9.6 Register Maps
      1. 9.6.1 Complete Register Set
      2. 9.6.2 Detailed Register Descriptions
        1. 9.6.2.1  INTERRUPT Register
        2. 9.6.2.2  INTERRUPT MASK Register
        3. 9.6.2.3  POWER EVENT Register
        4. 9.6.2.4  DETECTION EVENT Register
        5. 9.6.2.5  FAULT EVENT Register
        6. 9.6.2.6  START/ILIM EVENT Register
        7. 9.6.2.7  SUPPLY and FAULT EVENT Register
          1. 9.6.2.7.1 Detected SRAM Faults and "Safe Mode"
        8. 9.6.2.8  CHANNEL 1 DISCOVERY Register
        9. 9.6.2.9  CHANNEL 2 DISCOVERY Register
        10. 9.6.2.10 CHANNEL 3 DISCOVERY Register
        11. 9.6.2.11 CHANNEL 4 DISCOVERY Register
        12. 9.6.2.12 POWER STATUS Register
        13. 9.6.2.13 PIN STATUS Register
        14. 9.6.2.14 OPERATING MODE Register
        15. 9.6.2.15 DISCONNECT ENABLE Register
        16. 9.6.2.16 DETECT/CLASS ENABLE Register
        17. 9.6.2.17 Power Priority / 2Pair PCUT Disable Register Name
        18. 9.6.2.18 TIMING CONFIGURATION Register
        19. 9.6.2.19 GENERAL MASK Register
        20. 9.6.2.20 DETECT/CLASS RESTART Register
        21. 9.6.2.21 POWER ENABLE Register
        22. 9.6.2.22 RESET Register
        23. 9.6.2.23 ID Register
        24. 9.6.2.24 Connection Check and Auto Class Status Register
        25. 9.6.2.25 2-Pair Police Ch-1 Configuration Register
        26. 9.6.2.26 2-Pair Police Ch-2 Configuration Register
        27. 9.6.2.27 2-Pair Police Ch-3 Configuration Register
        28. 9.6.2.28 2-Pair Police Ch-4 Configuration Register
        29. 9.6.2.29 Capacitance (Legacy PD) Detection
        30. 9.6.2.30 Power-on Fault Register
        31. 9.6.2.31 PORT RE-MAPPING Register
        32. 9.6.2.32 Channels 1 and 2 Multi Bit Priority Register
        33. 9.6.2.33 Channels 3 and 4 Multi Bit Priority Register
        34. 9.6.2.34 Port Power Allocation Register
        35. 9.6.2.35 TEMPERATURE Register
        36. 9.6.2.36 INPUT VOLTAGE Register
        37. 9.6.2.37 CHANNEL 1 CURRENT Register
        38. 9.6.2.38 CHANNEL 2 CURRENT Register
        39. 9.6.2.39 CHANNEL 3 CURRENT Register
        40. 9.6.2.40 CHANNEL 4 CURRENT Register
        41. 9.6.2.41 CHANNEL 1 VOLTAGE Register
        42. 9.6.2.42 CHANNEL 2 VOLTAGE Register
        43. 9.6.2.43 CHANNEL 3 VOLTAGE Register
        44. 9.6.2.44 CHANNEL 4 VOLTAGE Register
        45. 9.6.2.45 2x FOLDBACK SELECTION Register
        46.       93
        47. 9.6.2.46 FIRMWARE REVISION Register
        48. 9.6.2.47 I2C WATCHDOG Register
        49. 9.6.2.48 DEVICE ID Register
        50. 9.6.2.49 CHANNEL 1 DETECT RESISTANCE Register
        51. 9.6.2.50 CHANNEL 2 DETECT RESISTANCE Register
        52. 9.6.2.51 CHANNEL 3 DETECT RESISTANCE Register
        53. 9.6.2.52 CHANNEL 4 DETECT RESISTANCE Register
        54. 9.6.2.53 CHANNEL 1 DETECT CAPACITANCE Register
        55. 9.6.2.54 CHANNEL 2 DETECT CAPACITANCE Register
        56. 9.6.2.55 CHANNEL 3 DETECT CAPACITANCE Register
        57. 9.6.2.56 CHANNEL 4 DETECT CAPACITANCE Register
        58. 9.6.2.57 CHANNEL 1 ASSIGNED CLASS Register
        59. 9.6.2.58 CHANNEL 2 ASSIGNED CLASS Register
        60. 9.6.2.59 CHANNEL 3 ASSIGNED CLASS Register
        61. 9.6.2.60 CHANNEL 4 ASSIGNED CLASS Register
        62. 9.6.2.61 AUTO CLASS CONTROL Register
        63. 9.6.2.62 CHANNEL 1 AUTO CLASS POWER Register
        64. 9.6.2.63 CHANNEL 2 AUTO CLASS POWER Register
        65. 9.6.2.64 CHANNEL 3 AUTO CLASS POWER Register
        66. 9.6.2.65 CHANNEL 4 AUTO CLASS POWER Register
        67. 9.6.2.66 ALTERNATIVE FOLDBACK Register
        68. 9.6.2.67 SRAM CONTROL Register
          1. 9.6.2.67.1 SRAM START ADDRESS (LSB) Register
          2. 9.6.2.67.2 SRAM START ADDRESS (MSB) Register
          3. 9.6.2.67.3 118
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Introduction to PoE
        1. 10.1.1.1 2-Pair Versus 4-Pair Power and the New IEEE802.3bt Standard
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 Connections on Unused Channels
        2. 10.2.2.2 Power Pin Bypass Capacitors
        3. 10.2.2.3 Per Port Components
        4. 10.2.2.4 System Level Components (not shown in the schematic diagrams)
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
    1. 11.1 VDD
    2. 11.2 VPWR
  12. 12Layout
    1. 12.1 Layout Guidelines
      1. 12.1.1 Kelvin Current Sensing Resistors
    2. 12.2 Layout Example
      1. 12.2.1 Component Placement and Routing Guidelines
        1. 12.2.1.1 Power Pin Bypass Capacitors
        2. 12.2.1.2 Per-Port Components
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 Support Resources
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrical Characteristics

Conditions are –40 < T < 125 °C unless otherwise noted.VVDD = 3.3 V,VVPWR = 54 V, VDGND = VAGND,DGND, KSENSA, KSENSB, KSENSC and KSENSD connected to AGND, and all outputs are unloaded, 2xFBn =0.  Positive currents are into pins. RS = 0.200 Ω, to KSENSA (SEN1 orSEN2), to KSENSB (SEN3 or SEN4), to KSENSC (SEN5 or SEN6) or to KSENSD (SEN7 or SEN8). Typical values are at 25 °C. All voltages are with respect to AGND unless otherwise noted. Operating registers loaded with default values unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
INPUT SUPPLY VPWR
IVPWR VPWR Current consumption VVPWR = 54 V 10 12.5 mA
VUVLOPW_F VPWR UVLO falling threshold Check internal oscillator stops operating 14.5 17.5 V
VUVLOPW_R VPWR UVLO rising threshold 15.5 18.5 V
VPUV_F VPWR Undervoltage falling threshold VPUV threshold 25 26.5 28 V
INPUT SUPPLY VDD
IVDD VDD Current consumption 6 12 mA
VUVDD_F VDD UVLO falling threshold For channel deassertion 2.1 2.25 2.4 V
VUVDD_R VDD UVLO rising threshold 2.45 2.6 2.75 V
VUVDD_HYS Hysteresis VDD UVLO 0.35 V
VUVW_F VDD UVLO warning threshold VDD falling 2.6 2.8 3 V
A/D CONVERTERS
TCONV_I Conversion time All ranges, each channel 0.64 0.8 0.96 ms
TCONV_V Conversiontime All ranges, each channel 0.82 1.03 1.2 ms
TINT_CUR Integration time, Current Each channel, channel ON current 82 102 122 ms
TINT_DET Integration time, Detection 13.1 16.6 20 ms
TINT_channelV Integration time, Channel Voltage channel powered 3.25 4.12 4.9 ms
TINT_inV Integration time, Input Voltage 3.25 4.12 4.9 ms
Input voltage conversion scale factor and accuracy VVPWR = 57 V 15175 15565 15955 Counts
55.57 57 58.43 V
VVPWR = 44 V 11713 12015 12316 Counts
42.89 44 45.10 V
Powered Channel voltage conversion scale factor and accuracy VVPWR - VDRAINn = 57 V 15175 15565 15955 Counts
55.57 57 58.43 V
VVPWR - VDRAINn = 44 V 11713 12015 12316 Counts
42.89 44 45.10 V
δV/VChannel Voltage reading accuracy –2.5 2.5 %
Powered Channel current conversion scale factor and accuracy Channel current = 770 mA 8431 8604 8776 Counts
754.5 770 785.4 mA
Channel Current = 100 mA 1084 1118 1152 Counts
97 100 103 mA
δI/IChannel Current reading accuracy Channel Current =100 mA –3 3 %
Channel Current =770 mA –2 2
δR/RChannel Resistance reading accuracy 15 kΩ ≤ RChannel ≤ 33 kΩ, CChannel ≤ 0.25 µF –7 7 %
Ibias Sense Pin bias current Channel ON or during class –2.5 0 µA
GATE 1-8
VGOH Gate drive voltage VGATEn , IGATE = -1 µA 10 12.5 V
IGO- Gate sinking current with Power-on Reset, OSS detected or channel turnoff command VGATEn = 5 V 60 100 190 mA
IGO short- Gate sinking current with channel short-circuit VGATEn = 5 V,
VSENn  ≥ Vshort (or Vshort2X if 2X mode)
60 100 190 mA
IGO+ Gate sourcing current VGATEn = 0 V, default selection 39 50 63 µA
tD_off_OSS Gate turnoff time from 1-bit OSS input From OSS to VGATEn < 1 V,
VSENn = 0 V, MbitPrty = 0
1 5 µs
tOSS_OFF Gate turnoff time from 3-bit OSS input From Start bit falling edge to VGATEn < 1 V,
VSENn = 0 V, MbitPrty = 1
72 104 µs
tP_off_CMD Gate turnoff time from channel turnoff command From Channel off command (POFFn = 1) to VGATEn < 1 V, VSENn = 0 V 300 µs
tP_off_RST Gate turnoff time with /RESET From /RESET low to VGATEn < 1 V, VSENn = 0 V 1 5 µs
DRAIN 1-8
VPGT Power-Good threshold Measured at VDRAINn 1 2.13 3 V
VSHT Shorted FET threshold Measured at VDRAINn 4 6 8 V
RDRAIN Resistance from DRAINn to VPWR Any operating mode except during detection or while the Channel is ON, including in device RESET state 80 100 190
AUTOCLASS
tClass_ACS Start of Autoclass Detection Measured from the start of Class 90 100 ms
tAUTO_PSE1 Start of Autoclass Power Measurement Measured from the end of Inrush 1.4 1.6 s
Measured from setting the MACx bit while channel is already powered 10 ms
tAUTO Duration of Autoclass Power Measurement 1.7 1.8 1.9 s
tAUTO_window Autoclass Power Measurement Sliding Window 0.15 0.3 s
PAC Autoclass Channel Power conversion scale factor and accuracy VPWR = 52 V, VDRAINn = 0 V,
Channel current = 770 mA
76 80 84 Counts
VPWR = 50 V, VDRAINn = 0 V,
Channel current = 100 mA
9 10 11
DETECTION
IDISC Detection current First and 3rd detection points
VVPWR - VDRAINn = 0 V
145 160 190 µA
2nd and 4th detection points VVPWR - VDRAINn = 0 V 235 270 300
ΔIDISC 2nd – 1st detection currents VVPWR - VDRAINn = 0 V 98 110 118 µA
Vdet_open Open circuit detection voltage Measured as VVPWR - VDRAINn 23.5 26 29 V
RREJ_LOW Rejected resistance low range 0.86 15
RREJ_HI Rejected resistance high range 33 100
RACCEPT Accepted resistance range 19 25 26.5
RSHORT Shorted Channel threshold 360 Ω
ROPEN Open Channel Threshold 400
tDET Detection Duration Time to complete a detection 275 350 425 ms
tDET_BOFF Detect backoff pause between discovery attempts VVPWR - VDRAINn > 2.5 V 300 400 500 ms
VVPWR - VDRAINn < 2.5 V 20 100 ms
tDET_DLY Detection delay From command or PD attachment to Channel detection complete 590 ms
Capacitance Measurement Cport = 10uF 8.5 10 11.5 uF
CLASSIFICATION
VCLASS Classification Voltage VVPWR - VDRAINn, VSENn ≥ 0 mV
Ichannel ≥ 180 µA
15.5 18.5 20.5 V
ICLASS_Lim Classification Current Limit VVPWR - VDRAINn = 0 V 65 75 90 mA
ICLASS_TH Classification Threshold Current Class 0-1 5 8 mA
Class 1-2 13 16 mA
Class 2-3 21 25 mA
Class 3-4 31 35 mA
Class 4-Class overcurrent 45 51 mA
tLCE Classification Duration (1st Finger) From detection complete 95 105 ms
tCLE2/3 Classification Duration (2nd & 3th Finger) From Mark complete 6.5 12 ms
MARK
VMARK Mark Voltage 4 mA ≥ IChannel ≥ 180 µA
VVPWR - VDRAINn
7 10 V
IMARK_Lim Mark Sinking Current Limit VVPWR - VDRAINn = 0 V 60 75 90 mA
tME Mark Duration 6 12 ms
DC DISCONNECT
VIMIN DC disconnect threshold 0.8 1.3 1.8 mV
tMPDO PD Maintain Power signature dropout time limit TMPDO = 00 320 400 ms
TMPDO = 01 75 100 ms
TMPDO = 10 150 200 ms
TMPDO = 11 600 800 ms
tMPS PD Maintain Power Signature time for validity 2.5 3 ms
PORT POWER POLICING
δPCUT/PCUT PCUT tolerance POL ≤ 15W 0 5 10 %
δPCUT/PCUT PCUT tolerance 15W < POL < 60W 0 3 6 %
tOVLD PCUT time limit TOVLD = 00 50 70 ms
TOVLD = 01 25 35
TOVLD = 10 100 140
TOVLD = 11 200 280
PORT CURRENT INRUSH
VInrush IInrush limit, ALTIRNn = 0 VVPWR - VDRAINn = 1 V 19 30 41 mV
VVPWR - VDRAINn = 10 V 19 30 41
VVPWR - VDRAINn = 15 V 33 44 55
VVPWR - VDRAINn = 30 V 80 90
VVPWR - VDRAINn = 55 V 80 90
IInrush limit, ALTIRNn = 1 VVPWR - VDRAINn = 1 V 19 30 41
VVPWR - VDRAINn = 10 V 36 47 58
VVPWR - VDRAINn = 15 V 53 64 75
VVPWR - VDRAINn = 30 V 80 90
VVPWR - VDRAINn = 55 V 80 90
tSTART Maximum current limit duration in start-up TSTART = 00 50 70 ms
TSTART = 01 25 35
TSTART = 10 100 140
PORT CURRENT FOLDBACK
VLIM ILIM 1X limit, 2xFB = 0 and ALTFBn = 0 VDRAINn = 1 V 80 90 mV
VDRAINn = 15 V 80 90
VDRAINn = 30 V 51 58 65
VDRAINn = 50 V 23 30 37
ILIM 1X limit, 2xFB = 0 and ALTFBn = 1 VDRAINn = 1 V 80 90
VDRAINn = 25 V 80 90
VDRAINn = 40 V 45 51 57
VDRAINn = 50 V 23 30 37
VLIM2X ILIM 2X limit, 2xFB = 1 and ALTFBn = 0 VDRAINn = 1 V 245 250 262 mV
VDRAINn = 10 V 164 180 196
VDRAINn = 30 V 51 58 64
VDRAINn = 50 V 23 30 37
ILIM 2X limit, 2xFB = 1 and ALTFBn = 1 VDRAINn = 1 V 245 250 262
VDRAINn = 20 V 139 147 155
VDRAINn = 40 V 45 51 57
VDRAINn = 50 V 23 30 37
tLIM ILIM time limit 2xFBn = 0 55 60 65 ms
2xFBn = 1 TLIM = 00 55 60 65
TLIM = 01 15 16 17
TLIM = 10 10 11 12
TLIM = 11 6 6.5 7
SHORT CIRCUIT DETECTION
Vshort ISHORT threshold in 1X mode and during inrush 205 245 mV
Vshort2X ISHORT threshold in 2X mode 280 320
tD_off_SEN Gate turnoff time from SENn input 2xFBn = 0, VDRAINn = 1 V
From VSENn pulsed to 0.425 V.
0.9 µs
2xFBn = 1, VDRAINn = 1 V
From VSENn pulsed to 0.62 V.
0.9
CURRENT FAULT RECOVERY (BACKOFF) TIMING
ted Error delay timing. Delay before next attempt to power a channel following power removal due to error condition PCUT , ILIM or IInrush fault Semi-auto mode 0.8 1 1.2 s
δIfault Duty cycle of Ichannel with current fault 5.5 6.7 %
THERMAL SHUTDOWN
Shutdown temperature Temperature rising 135 146 °C
Hysteresis 7 °C
DIGITAL I/O (SCL, SDAI, A1-A4, /RESET, OSS unless otherwise stated)
VIH Digital input High 2.1 V
VIL Digital input Low 0.9 V
VIT_HYS Input voltage hysteresis 0.17 V
VOL Digital output Low SDAO at 9mA 0.4 V
Digital output Low /INT at 3mA 0.4 V
Rpullup Pullup resistor to VDD /RESET, A1-A4, TEST0 30 50 80
Rpulldown Pulldown resistor to DGND OSS, TEST1, TEST2 30 50 80
tFLT_INT Fault to /INT assertion Time to internally register an Interrupt fault, from Channel turn off 50 500 µs
TRESETmin /RESET input minimum pulse width 5 µs
Tbit_OSS 3-bit OSS bit period MbitPrty = 1 24 25 26 µs
tOSS_IDL Idle time between consecutive shutdown code transmission in 3-bit mode MbitPrty = 1 48 50 µs
tr_OSS Input rise time of OSS in 3-bit mode 0.8 V → 2.3 V, MbitPrty = 1 1 300 ns
tf_OSS Input fall time of OSS in 3-bit mode 2.3 V → 0.8 V, MbitPrty = 1 1 300 ns
I2C TIMING REQUIREMENTS
tPOR Device power-on reset delay 20 ms
fSCL SCL clock frequency 10 400 kHz
tLOW LOW period of the clock 0.5 µs
tHIGH HIGH period of the clock 0.26 µs
tfo SDAO output fall time SDAO, 2.3 V → 0.8 V, Cb = 10 pF, 10 kΩ pull-up to 3.3 V 10 50 ns
SDAO, 2.3 V → 0.8 V, Cb = 400 pF, 1.3 kΩ pull-up to 3.3 V 10 50 ns
CI2C SCL capacitance 10 pF
CI2C_SDA SDAI, SDAO capacitance 6 pF
tSU,DATW Data setup tme (Write operation) 50 ns
tHD,DATW Data hold time (Write operation) 0 ns
tHD,DATR Data hold time (Read operation) 150 400 ns
tfSDA Input fall times of SDAI 2.3 V → 0.8 V 20 120 ns
trSDA Input rise times of SDAI 0.8 V → 2.3 V 20 120 ns
tr Input rise time of SCL 0.8 V → 2.3 V 20 120 ns
tf Input fall time of SCL 2.3 V → 0.8 V 20 120 ns
tBUF Bus free time between a STOP and START condition 0.5 µs
tHD,STA Hold time After (Repeated) START condition 0.26 µs
tSU,STA Repeated START condition setup time 0.26 µs
tSU,STO STOP condition setup time 0.26 µs
tDG Suppressed spike pulse width, SDAI and SCL 50 ns
tWDT_I2C I2C Watchdog trip delay 1.1 2.2 3.3 sec