SLUS334F August   1995  – August 2022 UC1823A , UC1825A , UC2823A , UC2823B , UC2825A , UC2825B , UC3823A , UC3823B , UC3825A , UC3825B

PRODUCTION DATA  

  1. 1Features
  2. 2Description
  3. 3Revision History
  4. 4Ordering Information
  5. 5Pin Configuration and Functions
    1.     Terminal Functions
  6. 6Specifications
    1. 6.1 ABSOLUTE MAXIMUM RATINGS
    2. 6.2 Thermal Information
    3. 6.3 ELECTRICAL CHARACTERISTICS
    4. 6.4 ELECTRICAL CHARACTERISTICS
  7. 7Application and Implementation
    1. 7.1 LEADING EDGE BLANKING
    2. 7.2 UVLO, SOFT-START AND FAULT MANAGEMENT
    3. 7.3 ACTIVE LOW OUTPUTS DURING UVLO
    4. 7.4 CONTROL METHODS
    5. 7.5 SYNCHRONIZATION
    6. 7.6 HIGH CURRENT OUTPUTS
    7. 7.7 GROUND PLANES
    8. 7.8 OPEN LOOP TEST CIRCUIT
  8. 8Device and Documentation Support
    1. 8.1 Documentation Support
    2. 8.2 Receiving Notification of Documentation Updates
    3. 8.3 Support Resources
    4. 8.4 Trademarks
    5. 8.5 Electrostatic Discharge Caution
    6. 8.6 Glossary
  9. 9Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • J|16
Thermal pad, mechanical data (Package|Pins)
Orderable Information

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range unless otherwise noted(1)
VALUEUNIT
VINSupply voltage,VC, VCC22V
IOSource or sink current,DCOUTA, OUTB0.5A
IOSource or sink current, pulse (0.5 μs)OUTA, OUTB2.2A
Analog inputsINV, NI, RAMP–0.3 to 7V
ILIM, SS–0.3 to 6V
Power groundPGND±0.2V
ICLKClock output currentCLK/LEB–5mA
IO(EA)Error amplifier output currentEAOUT5mA
ISSSoft-start sink currentSS20mA
IOSCOscillator charging currentRT–5mA
TJOperating virtual junction temperature range–55 to 150°C
TstgStorage temperature–65 to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds–55 to 150°C
tSTGStorage temperature–65 to 150°C
Lead temperature 1,6 mm (1/16 inch) from cases for 10 seconds300°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.