SLUSF10B february   2023  – june 2023 UCC14141-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Device Comparison
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Insulation Specifications
    6. 7.6  Safety-Related Certifications
    7. 7.7  Electrical Characteristics
    8. 7.8  Safety Limiting Values
    9. 7.9  Insulation Characteristics
    10. 7.10 Typical Characteristics
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Power Stage Operation
        1. 8.3.1.1 VDD-VEE Voltage Regulation
        2. 8.3.1.2 COM-VEE Voltage Regulation
        3. 8.3.1.3 Power Handling Capability
      2. 8.3.2 Output Voltage Soft Start
      3. 8.3.3 ENA and PG
      4. 8.3.4 Protection Functions
        1. 8.3.4.1 Input Undervoltage Lockout
        2. 8.3.4.2 Input Overvoltage Lockout
        3. 8.3.4.3 Output Undervoltage Protection
        4. 8.3.4.4 Output Overvoltage Protection
        5. 8.3.4.5 Overpower Protection
        6. 8.3.4.6 Overtemperature Protection
    4. 8.4 Device Functional Modes
  10. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Capacitor Selection
        2. 9.2.2.2 Single RLIM Resistor Selection
        3. 9.2.2.3 RDR Circuit Component Selection
    3. 9.3 System Examples
    4. 9.4 Power Supply Recommendations
    5. 9.5 Layout
      1. 9.5.1 Layout Guidelines
      2. 9.5.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 Receiving Notification of Documentation Updates
    3. 10.3 Support Resources
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 Glossary
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.4 Thermal Information

THERMAL METRIC(1) UNIT
DWN (SOIC)
36 PINS
RθJA Junction-to-ambient thermal resistance 52.3 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 28.5 °C/W
RθJB Junction-to-board thermal resistance 25.9 °C/W
ΨJA Junction-to-ambient characterization parameter 29.5 °C/W
ΨJT Junction-to-top characterization parameter 16.6 °C/W
ΨJB Junction-to-board characterization parameter 25.6 °C/W
(1) The thermal resistances (R) are based on JEDEC board, and the characterization parameters (Ψ) are based on the EVM described in the Layout section. For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.