SLUSE36G July   2021  – September 2022 BQ77216

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Description (continued)
  6. Device Comparison Table
  7. Pin Configuration and Functions
  8. Specifications
    1. 8.1 Absolute Maximum Ratings
    2. 8.2 ESD Ratings
    3. 8.3 Recommended Operating Conditions
    4. 8.4 Thermal Information
    5. 8.5 DC Characteristics
    6. 8.6 Timing Requirements
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Voltage Fault Detection
      2. 9.3.2 Open Wire Fault Detection
      3. 9.3.3 Temperature Fault Detection
      4. 9.3.4 Oscillator Health Check
      5. 9.3.5 Sense Positive Input for Vx
      6. 9.3.6 Output Drive, COUT and DOUT
      7. 9.3.7 The LATCH Function
      8. 9.3.8 Supply Input, VDD
    4. 9.4 Device Functional Modes
      1. 9.4.1 NORMAL Mode
      2. 9.4.2 FAULT Mode
      3. 9.4.3 Customer Test Mode
  10. 10Application and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Design Requirements
      2. 10.1.2 Detailed Design Procedure
        1. 10.1.2.1 Cell Connection Sequence
    2. 10.2 Systems Example
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Third-Party Products Disclaimer
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 Support Resources
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Features

  • 3-series cell to 16-series cell protection
  • High-accuracy over voltage protection
    • ± 10 mV at 25°C
    • ± 20 mV from 0°C to 60°C
  • Overvoltage protection options from 3.55 V to
    5.1 V
  • Undervoltage protection with options from 1.0 V to 3.5 V
  • Open-wire connection detection
  • Overtemperature protection
  • Random cell connection
  • Functional safety-capable
  • Fixed internal delay timers
  • Fixed detections thresholds
  • Fixed output drive type for each of COUT and DOUT
    • Active high or active low
    • Active high drive to 6 V
    • Open drain with ability to be pulled up externally to VDD
  • Low power consumption ICC ≈ 1 µA
    (VCELL(ALL) < VOV)
  • Low leakage current per cell input < 100 nA with open wire detection disabled
  • Package footprint options:
    • Leaded 24-pin TSSOP with 0.65-mm lead pitch