SNVSA18C April   2014  – August 2014 ADC16DX370

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  Handling Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Converter Performance Characteristics
    6. 6.6  Power Supply Electrical Characteristics
    7. 6.7  Analog Interface Electrical Characteristics
    8. 6.8  CLKIN, SYSREF, SYNCb Interface Electrical Characteristics
    9. 6.9  Serial Data Output Interface Electrical Characteristics
    10. 6.10 Digital Input Electrical Interface Characteristics
    11. 6.11 Timing Requirements
    12. 6.12 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 Over-Range Functional Characteristics
    2. 7.2 Input Clock Divider and Clock Phase Adjustment Functional Characteristics
    3. 7.3 JESD204B Interface Functional Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Amplitude and Phase Imbalance Correction of Differential Analog Input
      2. 8.3.2  DC Offset Correction
      3. 8.3.3  Over-Range Detection
      4. 8.3.4  Input Clock Divider
      5. 8.3.5  SYSREF Offset Feature and Detection Gate
      6. 8.3.6  Sampling Instant Phase Adjustment
      7. 8.3.7  Serial Differential Output Drivers
        1. 8.3.7.1 De-Emphasis Equalization
      8. 8.3.8  ADC Core Calibration
      9. 8.3.9  Data Format
      10. 8.3.10 JESD204B Supported Features
      11. 8.3.11 Transport Layer Configuration
        1. 8.3.11.1 Lane Configuration
        2. 8.3.11.2 Frame Format
        3. 8.3.11.3 ILA Information
      12. 8.3.12 Test Pattern Sequences
      13. 8.3.13 JESD204B Link Initialization
      14. 8.3.14 SPI
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power-Down and Sleep Modes
    5. 8.5 Register Map
      1. 8.5.1 Register Descriptions
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Analog Input Considerations
        1. 9.1.1.1 Differential Analog Inputs and Full Scale Range
        2. 9.1.1.2 Analog Input Network Model
        3. 9.1.1.3 Input Bandwidth
        4. 9.1.1.4 Driving the Analog Input
        5. 9.1.1.5 Clipping and Over-Range
      2. 9.1.2 CLKIN, SYSREF, and SYNCb Input Considerations
        1. 9.1.2.1 Driving the CLKIN+ and CLKIN- Input
        2. 9.1.2.2 Clock Noise and Edge Rate
        3. 9.1.2.3 Driving the SYSREF Input
        4. 9.1.2.4 SYSREF Signaling
        5. 9.1.2.5 SYSREF Timing
        6. 9.1.2.6 Effectively Using the SYSREF Offset and Detection Gate Features
        7. 9.1.2.7 Driving the SYNCb Input
      3. 9.1.3 Output Serial Interface Considerations
        1. 9.1.3.1 Output Serial-Lane Interface
        2. 9.1.3.2 Voltage Swing and De-Emphasis Optimization
        3. 9.1.3.3 Minimizing EMI
      4. 9.1.4 JESD204B System Considerations
        1. 9.1.4.1 Frame and LMFC Clock Alignment Procedure
        2. 9.1.4.2 Link Interruption
        3. 9.1.4.3 Synchronization Requests and SYNCb Alignment in Multi-Device Systems
        4. 9.1.4.4 Clock Configuration Examples
        5. 9.1.4.5 Configuring the JESD204B Receiver
      5. 9.1.5 SPI
    2. 9.2 Typical Application
      1. 9.2.1 High-IF Sampling Receiver
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Design Procedure
        3. 9.2.1.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 Power Supply Design
    2. 10.2 Decoupling
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
    3. 11.3 Thermal Considerations
  12. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 Specification Definitions
      2. 12.1.2 JESD204B Definitions
    2. 12.2 Trademarks
    3. 12.3 Electrostatic Discharge Caution
    4. 12.4 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

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12 Device and Documentation Support

12.1 Device Support

12.1.1 Specification Definitions

    3-dB BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental deviates 3 dB from its low frequency value relative to the differential voltage signal applied at the device input pins.
    APERTURE DELAY is the time delay between the rising edge of the clock until the input signal is acquired or held for conversion.
    APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample.
    CLOCK DUTY CYCLE is the ratio of the time during one cycle that a repetitive digital waveform is high to the total time of one period. The specification here refers to the ADC clock input signal.
    COMMON MODE VOLTAGE (VCM) is the common DC voltage applied to both terminals of the ADC differential input.
    COMMON MODE REJECTION RATIO (CMRR) is the ratio of the magnitude of the single-tone spur in the sampled spectrum (referred to the ADC analog input as a peak voltage quantity) to the peak voltage swing of a sinusoid simultaneously incident on the positive and negative terminals of a differential analog input as a common-mode signal from which the spur generated. CMRR is typically expressed in decibels [dB].
    CROSSTALK is the coupling of energy from one channel into the other channel.
    DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 least significant bit (LSB)
    GAIN VARIATION is the expected standard deviation in the gain of the converter from an applied voltage to output codes between parts or between channels.
    INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a best-fit straight line. The deviation of any given code from this straight line is measured from the center of that code value.
    INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two sinusoidal frequencies being applied to the ADC input at the same time. It quantifies the power of the largest intermodulation product adjacent to the input tones, expressed in dBFS.
    LEAST SIGNIFICANT BIT (LSB) is the bit that has the smallest value or weight of all bits. This value is VFS / 2n, where VFSis the full scale input voltage and n is the ADC resolution in bits.
    MISSING CODES are those output codes that do not appear at the ADC outputs. The ADC16DX370 device is specified not to have missing codes.
    MOST SIGNIFICANT BIT (MSB) is the bit that has the largest value or weight. Its value is one half of full scale.
    OFFSET ERROR is the difference between the two input voltages (VIN+ – VIN–) required to cause a transition from code 32767LSB and 32768LSB with offset binary data format.
    POWER SUPPLY SENSITIVITY is a measure of the sensitivity of the power supplies to noise. In this specification, a supply is modulated with a 100-mV, 500-kHz sinusoid and the resulting spurs in the spectrum are measured. The sensitivity is expressed relative to the power of a possible full-scale sinusoid [dBFS].
    SAMPLE-TO-PARALLEL OUT (S2PO) LATENCY is the number of frame clock cycles between initiation of conversion and the time when the parallel sample data is available at the output of the receiver’s elastic buffer. This latency is specified to be deterministic if the JESD204B subclass 1 requirements are satisfied.
    SAMPLE-TO-SERIAL OUT (S2SO) LATENCY is the number of frame clock cycles between initiation of conversion and the time when the first bit of serial data for that sample is present at the output driver. This latency is not specified to be deterministic.
    SECOND HARMONIC DISTORTION (2ND HARM or HD2) is the ratio, expressed in dB, of the power of the input signal’s 2nd harmonic to the power of the input signal. HD2 is usually expressed relative to the power of a possible full-scale sinusoid [dBFS] or relative to the power of the actual input carrier signal [dBc].
    SIGNAL-TO-NOISE AND DISTORTION (SINAD) is the ratio, expressed in dB, of the power of the input signal to the total power of all of the other spectral components, including harmonics but excluding DC. SINAD is usually expressed relative to the power of a possible full-scale sinusoid [dBFS] or relative to the power of the actual input carrier signal [dBc].
    SIGNAL-TO-NOISE RATIO (SNR) is the ratio, expressed in dB, of the power of the input signal to the total power of all other spectral components, not including harmonics and DC. SNR is usually expressed relative to the power of a possible full-scale sinusoid [dBFS] or relative to the power of the actual input carrier signal [dBc].
    SPUR is the ratio, expressed in dB, of the power of the peak spurious signal to the power of the input signal, where a spurious signal is any signal present in the output spectrum that is not present at the input excluding the second and third harmonic distortion. SPUR is usually expressed relative to the power of a possible full-scale sinusoid [dBFS] or relative to the power of the actual input carrier signal [dBc].
    SPURIOUS FREE DYNAMIC RANGE (SFDR) is the ratio, expressed in dB, of the input signal power to the peak spurious signal power, where a spurious signal is any signal present in the output spectrum that is not present at the input. SINAD is usually expressed relative to the power of a possible full-scale sinusoid [dBFS] or relative to the power of the actual input carrier signal [dBc].
    THIRD HARMONIC DISTORTION (3RD HARM or HD3) is the ratio, expressed in dB, of the power of the input signal’s 3rd harmonic to the power of the input signal. HD3 is usually expressed relative to the power of a possible full-scale sinusoid [dBFS] or relative to the power of the actual input carrier signal [dBc].
    TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dB, of the total power of the first eight harmonics (HD2 through HD9) to the input signal power. THD is usually expressed relative to the power of a possible full-scale sinusoid [dBFS] or relative to the power of the actual input carrier signal [dBc].

12.1.2 JESD204B Definitions

    DEVICE CLOCK is a master clock signal from which a device must generate its local frame and local multi-frame clocks. For the ADC16DX370 device, this refers to the signal at the CLKIN input.
    FRAME is a set of consecutive octets in which the position of each octet can be identified by references to a frame alignment signal.
    FRAME CLOCK is a signal used for sequencing frames or monitoring their alignment. For the ADC16DX370 device, this clock is internally generated and is not externally accessible.
    LINK (DATA LINK) is an assembly, consisting of parts of two devices and the interconnecting data circuit, that is controlled by a long protocol enabling data to be transferred from a data source to a data sink. The link includes portions of the ADC16DX370 device (transmitter), FPGA or ASIC (receiver), and the hardware that connects them.
    LOCAL MULTI-FRAME CLOCK (LMFC) is a signal used for sequencing multi-frames or monitoring their alignment. This clock is derived inside the ADC16DX370 device from the device clock and used in the implementation of the JESD204B link within the device.
    MULTI-FRAME is a set of consecutive frames in which the position of each frame can be identified by reference to a multi-frame alignment signal.
    OCTET is a group of eight adjacent binary digits, serving as the input to an 8B/10B encoder or the output of an 8B/10B decoder.
    SCRAMBLING is the randomization of the output data that is used to eliminate long strings of consecutive identical transmitted symbols and avoid the presence of spectral lines in the signal spectrum without changing the signaling rate.
    SERIAL LANE is a differential signal pair for data transmission in one direction.
    SYSREF is a periodic, one-shot, or gapped periodic signal used to align the boundaries of local multi-frame clocks in JESD204B subclass 1 compliant devices. SYSREF must be source synchronous with the device clock.

12.2 Trademarks

All trademarks are the property of their respective owners.

12.3 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

12.4 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.