JAJSHG0N November   1997  – April 2024 CD54HC4051 , CD54HC4052 , CD54HC4053 , CD54HCT4051 , CD74HC4051 , CD74HC4052 , CD74HC4053 , CD74HCT4051 , CD74HCT4052 , CD74HCT4053

PRODUCTION DATA  

  1.   1
  2. 特長
  3. アプリケーション
  4. 概要
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Thermal Information
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Electrical Characteristics: HC Devices
    6. 5.6  Electrical Characteristics: HCT Devices
    7. 5.7  Switching Characteristics, VCC = 5V
    8. 5.8  Switching Characteristics, CL = 50pF
    9. 5.9  Analog Channel Specifications
    10. 5.10 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagrams
    3. 7.3 Feature Description
    4. 7.4 Device Functional Modes
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 ドキュメントの更新通知を受け取る方法
    3. 9.3 サポート・リソース
    4. 9.4 Trademarks
    5. 9.5 静電気放電に関する注意事項
    6. 9.6 用語集
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

パッケージ・オプション

デバイスごとのパッケージ図は、PDF版データシートをご参照ください。

メカニカル・データ(パッケージ|ピン)
  • PW|16
  • N|16
  • D|16
サーマルパッド・メカニカル・データ
発注情報

Thermal Information

THERMAL METRIC(1) CD74HC4051 UNIT
N (PDIP) NS (SO) PW (TSSOP)
16 PINS 16 PINS 16 PINS
RθJA Junction-to-ambient thermal resistance  77.3 99.3 116.5 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 56.2 59.6 51.9 °C/W
RθJB Junction-to-board thermal resistance 52.6 65.7 73.9 °C/W
ΨJT Junction-to-top characterization parameter 33.7 21.5 4.7 °C/W
ΨJB Junction-to-board characterization parameter 52.1 65.1 73.2 °C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.