JAJSGB4A September 2018 – December 2018 TVS2701
PRODUCTION DATA.
The TVS2701 is specified according to both the IEC 61000-4-5 and IEC 61643-321 standards. This enables usage in systems regardless of which standard is required by relevant product standards or best matches measured fault conditions. The IEC 61000-4-5 standard requires protection against a pulse with a rise time of 8 µs and a half-length of 20 µs, while the IEC 61643-321 standard requires protection against a much longer pulse with a rise time of 10 µs and a half-length of 1000 µs.
The positive and negative surges are imposed to the TVS2701 by a combination wave generator (CWG) with a 2-Ω coupling resistor at different peak voltage levels. For powered-on transient tests that need power supply bias, inductances are used to decouple the transient stress and protect the power supply. The TVS2701 is post-tested by assuring that there is no shift in device breakdown or leakage at VRWM.
In addition, the TVS2701 has been tested according to IEC 61000-4-5 to pass a ±1-kV surge test through a 42-Ω coupling resistor and a 0.5-µF capacitor. This test is a common test requirement for industrial signal I/O lines and the TVS2701 precision clamp can be used in applications that have that requirement.
The TVS2701 integrates IEC 61000-4-2 level 4 ESD Protection and 80 A of IEC 61000-4-4 EFT Protection. These combine to ensure that the device can protect against most common transient test requirements.
For more information on TI's test methods for Surge, ESD, and EFT testing, refer to the IEC 61000-4-x Tests for TI's Protection Devices application report.