JAJSH28D November   2013  – March 2019 LM3697

PRODUCTION DATA.  

  1. 1 特長
  2. 2 アプリケーション
  3. 3 概要
    1.     Device Images
      1.      概略回路図
      2.      昇圧効率
  4. 4 改訂履歴
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
      1. 7.1.1 PWM Input
      2. 7.1.2 HWEN Input
      3. 7.1.3 Thermal Shutdown
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Descriptions
      1. 7.3.1 High-Voltage LED Control
        1. 7.3.1.1 High-Voltage Boost Converter
        2. 7.3.1.2 High-Voltage Current Sinks (HVLED1, HVLED2 and HVLED3)
        3. 7.3.1.3 High-Voltage Current String Biasing
      2. 7.3.2 Boost Switching-Frequency Select
      3. 7.3.3 Automatic Switching Frequency Shift
      4. 7.3.4 Brightness Register Current Control
        1. 7.3.4.1 8-Bit Control (Preferred)
        2. 7.3.4.2 11-Bit Control
      5. 7.3.5 PWM Control
        1. 7.3.5.1 PWM Input Frequency Range
        2. 7.3.5.2 PWM Input Polarity
        3. 7.3.5.3 PWM Zero Detection
      6. 7.3.6 Start-up/Shutdown Ramp
      7. 7.3.7 Run-Time Ramp
      8. 7.3.8 High-Voltage Control A and B Ramp Select
    4. 7.4 Device Functional Modes
      1. 7.4.1 LED Current Mapping Modes
        1. 7.4.1.1 Exponential Mapping
          1. 7.4.1.1.1 8-Bit Code Calculation
          2. 7.4.1.1.2 11-Bit Code Calculation
        2. 7.4.1.2 Linear Mapping
          1. 7.4.1.2.1 8-Bit Code Calculation
          2. 7.4.1.2.2 11-Bit Code Calculation
      2. 7.4.2 Fault Flags/Protection Features
        1. 7.4.2.1 Open LED String (HVLED)
        2. 7.4.2.2 Shorted LED String (HVLED)
        3. 7.4.2.3 Overvoltage Protection (Inductive Boost)
        4. 7.4.2.4 Current Limit (Inductive Boost)
      3. 7.4.3 I2C-Compatible Interface
        1. 7.4.3.1 Start And Stop Conditions
        2. 7.4.3.2 I2C-Compatible Address
        3. 7.4.3.3 Transferring Data
        4. 7.4.3.4 High-Speed Mode
    5. 7.5 Register Maps
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Boost Converter Maximum Output Power
          1. 8.2.2.1.1 Peak Current Limited
          2. 8.2.2.1.2 Output Voltage Limited
        2. 8.2.2.2 Inductor Selection
        3. 8.2.2.3 Output Capacitor Selection
        4. 8.2.2.4 Schottky Diode Selection
        5. 8.2.2.5 Input Capacitor Selection
        6. 8.2.2.6 Application Circuit Component List
      3. 8.2.3 Application Performance Plots
    3. 8.3 Initialization Set Up
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Boost Output Capacitor Placement
      2. 10.1.2 Schottky Diode Placement
      3. 10.1.3 Inductor Placement
      4. 10.1.4 Boost Input Capacitor Placement
    2. 10.2 Layout Example
  11. 11デバイスおよびドキュメントのサポート
    1. 11.1 デバイス・サポート
      1. 11.1.1 デベロッパー・ネットワークの製品に関する免責事項
    2. 11.2 関連資料
    3. 11.3 ドキュメントの更新通知を受け取る方法
    4. 11.4 コミュニティ・リソース
    5. 11.5 商標
    6. 11.6 静電気放電に関する注意事項
    7. 11.7 Glossary
  12. 12メカニカル、パッケージ、および注文情報

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VIN to GND −0.3 6 V
VSW, VOVP, VHVLED1, VHVLED2, VHVLED3 to GND −0.3 45 V
VSCL, VSDA, VPWM to GND −0.3 6 V
VHWEN to GND −0.3 6 V
Continuous power dissipation Internally Limited
Junction temperature (TJ-MAX) 150 °C
Storage temperature, Tstg −65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.