SBOK085 April   2024 SN54SC2T74-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Single-Event Transients (SET)
    3. 5.3 Event Rate Calculations
  9. 6Summary
  10. 7References

6 Summary

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the SN54SC2T74-SEP radiation-tolerant, 1.2V to 5.5V dual D-type flip-flop with integrated translation. SEE performance was verified at minimum (1.2V) and maximum (5.5V) operating conditions. Heavy-ions with an LETEFF of 43MeV-cm2/ mg were used to irradiate three production devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the SN54SC2T74-SEP is SEL-free up to LETEFF = 43MeV-cm2/ mg as 125°C. SET performance for minimum and maximum operating voltages saw no excursions ≥ |1%|, as shown and discussed in this report.