SBOK085 April   2024 SN54SC2T74-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Single-Event Transients (SET)
    3. 5.3 Event Rate Calculations
  9. 6Summary
  10. 7References

1 Overview

The SN54SC2T74-SEP is a radiation-tolerant, 1.2V to 5.5V dual D-type flip-flop with integrated translation. The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5V tolerant input pins enable down translation (for example, 3.3V to 2.5V output).

For more information, see the SN54SC2T74-SEP product page.

Table 1-1 Overview Information
Description Device Information
TI Part Number SN54SC2T74-SEP
MLS Number SN54SC2T74MPWTSEP
Device Function Radiation-tolerant, 1.2V to 5.5V, dual D-type flip-flop with integrated translation
Technology LBC9
Exposure Facility Radiation Effects Facility, Cyclotron Institute, Texas A&M University
Heavy Ion Fluence per Run 1 × 107 ions / cm2
Irradiation Temperature 25°C (for SET testing) and 125°C (for SEL testing)