SFFS094 April   2021 ISO6720 , ISO6720-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 8-D (narrow body SOIC) Package
    2. 2.2 8-SOIC (wide-body SOIC) Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 8-D (narrow-body SOIC) and 8-DWV (wide-body SOIC) Package
  6. 5Revision History

1 Overview

This document contains information for ISO6720/ISO6720-Q1 and ISO6720F/ISO6720F-Q1 (8-D and 8-DWV package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the functional block diagram of one channel of ISO6720/ISO6720-Q1 and ISO6720F/ISO6720F-Q1 for reference.

GUID-4AD0ACC7-755E-43F6-A2AA-BC96B10833D1-low.gifFigure 1-1 Functional Block Diagram

ISO6720/ISO6720-Q1 and ISO6720F/ISO6720F-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.