SFFS185 June   2021 LMR33620AP-Q1 , LMR33630AP-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Failure Mode Distribution (FMD)
  4. 3Functional Safety Failure In Time (FIT) Rates
    1. 3.1 LMR33630AP-Q1
    2. 3.2 LMR33620AP-Q1
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 LMR33630AP-Q1 and LMR33620AP-Q1

1 Overview

This document contains information for LMR33630AP-Q1 and LMR33620AP-Q1 in the VQFN-12 package (RNX designator) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-53195231-73C8-4141-9FE2-1A50871DD56F-low.gifFigure 1-1 Functional Block Diagram

LMR33630AP-Q1 and LMR33620AP-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.