SFFS596 april   2023 TLV767-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for the TLV767-Q1 (VSON package) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the adjustable output device functional block diagram for reference.

GUID-4AD367E8-3380-4D91-89EE-98BA3FD779DA-low.gif Figure 1-1 TLV767-Q1 Adjustable Output Functional Block Diagram

Figure 1-2 shows the fixed output device functional block diagram for reference.

GUID-7F34A5FC-3FD3-4E9F-8115-C76E9E702774-low.gif Figure 1-2 TLV767-Q1 Fixed Output Functional Block Diagram

The TLV767-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.