SLVK226 October 2025 TPS7H4012-SEP
- 1
- TPS7H4012-SEP and TPS7H4013-SEP Single-Event Effects (SEE)
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
During the SEB/SEGR characterization, the device was tested at room temperature of ≈25°C. The device was tested under both the enabled and disabled mode. For the SEB-OFF mode the device was disabled using the EN-pin by forcing 0V (using Channel 1 of a E36311A Keysight PS). During the SEB/SEGR testing with the device enabled/disabled, not a single input current event was observed.
The species used for the SEB testing was 109Ag (TAMU) at 15 MeV/nucleon and 109Ag (KSEE) at 19.5 MeV/nucleon. For both ions an angle of incidence of 0° was used to achieve a LETEFF of ≈ 48 MeV×cm2/mg (for more details refer to Table 5-1). The kinetic energy in the vacuum for 109Ag (TAMU) is 1.635 GeV and 109Ag (KSEE) is 2.125 GeV. Flux of ≈105 ions/cm2/s and a fluence of ≈107 ions/cm2 per run was used. Run duration to achieve this fluence was ≈2 minutes. The seven devices (same as used in SEL testing) were powered up and exposed to the heavy-ions using the maximum recommended input voltage of 14V with the max recommended load for each respective device. No SEB/SEGR current events were observed during the 14 runs, indicating that the TPS7H401x-SEP is SEB/SEGR-free up to LETEFF = 48 MeV×cm2/mg and across the full electrical specifications. Table 8-4 shows the SEB/SEGR test conditions and results.
Device | Run Number | Unit Number | Facility | Ion | LETEFF (MeV × cm2/mg) | Flux (ions/cm2/s) | Fluence (ions/cm2) | Enabled Status | VIN (V) | IOUT (A) | SEB EVENT? |
|---|---|---|---|---|---|---|---|---|---|---|---|
TPS7H4012-SEP | 8 | 1 | TAMU | 109Ag | 48 | 1.21 x 105 | 9.99 x 106 | EN | 14 | 6 | No |
| 9 | TAMU | 109Ag | 48 | 1.00 × 105 | 9.99 × 106 | DIS | 14 | - | No | ||
| 10 | 2 | TAMU | 109Ag | 48 | 1.03 × 105 | 1.00 × 107 | EN | 14 | 6 | No | |
11 | TAMU | 109Ag | 48 | 9.97 × 104 | 1.00 × 107 | DIS | 14 | - | No | ||
TPS7H4013-SEP | 12 | 3 | TAMU | 109Ag | 48 | 1.13 × 105 | 1.00 × 107 | EN | 14 | 3 | No |
| 13 | TAMU | 109Ag | 48 | 1.27 × 105 | 1.00 × 107 | DIS | 14 | - | No | ||
| 14 | 4 | TAMU | 109Ag | 48 | 1.25 × 105 | 1.00 × 107 | EN | 14 | 3 | No | |
| 15 | TAMU | 109Ag | 48 | 1.31 x 105 | 1.00 x 107 | DIS | 14 | - | No | ||
TPS7H4012-SEP | 16 | 5 | KSEE | 109Ag | 48 | 1.04 x 105 | 1.00 x 107 | EN | 14 | 6 | No |
17 | KSEE | 109Ag | 48 | 1.11 x 105 | 1.00 x 107 | DIS | 14 | - | No | ||
18 | 6 | KSEE | 109Ag | 48 | 1.07 x 105 | 1.00 x 107 | EN | 14 | 6 | No | |
19 | KSEE | 109Ag | 48 | 1.06 x 105 | 1.00 x 107 | DIS | 14 | - | No | ||
TPS7H4013-SEP | 20 | 7 | KSEE | 109Ag | 48 | 1.03 x 105 | 1.00 x 107 | EN | 14 | 3 | No |
21 | KSEE | 109Ag | 48 | 8.98 x 104 | 1.00 x 107 | DIS | 14 | - | No |
Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross-section (using a 95% confidence level) is calculated as:
σSEB ≤ 2.63 × 10-8 cm2/device for LETEFF = 48 MeV×cm2/mg and T = 25°C.
Figure 7-2 SEB On Current vs Time for Run 8 of the TPS7H4012-SEP at T = 25°C (VOUT = 3.3V)
Figure 7-3 SEB Off Current vs Time for Run 9 of the TPS7H4012-SEP at T = 25°C (VOUT = 0V)