SLVK235 September   2025 CDCLVP111-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5LETEFF and Range Calculation
  9. 6Test Setup and Procedures
  10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8Single-Event Transients (SET)
  12. 9Summary
  13.   A References

9 Summary

The goal of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the CDCLVP111-SEP 1:10 LVPECL Clock Distributor. Table 9-1 shows a tabulated summary of the results of all of the SEE testing. Heavy-ions with LETEFF ranging from 2.79 to 47.5MeVcm2/mg were used to irradiate four production devices in 76 experiments with heavy-ion fluences ranging from 1×106 to 1×107 ions/cm2 per run. The results demonstrate that the CDCLVP111-SEP is SEL free up to LETEFF = 47.5MeVcm2/mg.

The results demonstrate that SET occurs at a low onset but with a small saturation cross section. All of the observed SET events were also transitory, recovering fully within one clock cycle of the event. The presented summary is based on the characterization based at 200MHz, minimum voltage, and mean cross-sectional value.

Table 9-1 Summary of Results for all SEE Testing for CDCLVP111-SEP
LET (MeV·cm2/mg)SETSEL
WindowRuntPulse Width PositivePulse Width Negative
2.79SET - FreeSET - FreeSET - FreeSET - Free-
8.681SET - Free≤ 4.98 × 10-7≤ 1× 10-6≤ 2.06 × 10-6-
12.39SET - Free≤ 1.52 × 10-6≤ 2.99 × 10-6≤ 2.5 × 10-6-
30.79SET - Free≤ 8.29 × 10-6≤ 1.35 × 10-6≤ 1.22 × 10-6-
44.12SET - Free≤ 1.21 × 10-6≤ 1.04 × 10-6≤ 1.45 × 10-6-
47.5----SEL - Free