SNVA921C January   2020  – March 2024 LMR33620-Q1 , LMR33630-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 LMR33630-Q1
    2. 2.2 LMR33620-Q1
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 LMR33630AP-Q1 and LMR33620AP-Q1
  7. 5Revision History

1 Overview

This document contains information for LMR33630AP-Q1 and LMR33620AP-Q1 in the VQFN package to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-53195231-73C8-4141-9FE2-1A50871DD56F-low.gifFigure 1-1 Functional Block Diagram

LMR33630AP-Q1 and LMR33620AP-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.