SBAS499C July   2012  – January 2017 ADS1299 , ADS1299-4 , ADS1299-6

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Comparison
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements: Serial Interface
    7. 7.7 Switching Characteristics: Serial Interface
    8. 7.8 Typical Characteristics
  8. 8 Parametric Measurement Information
    1. 8.1 Noise Measurements
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Analog Functionality
        1. 9.3.1.1 Input Multiplexer
          1. 9.3.1.1.1 Device Noise Measurements
          2. 9.3.1.1.2 Test Signals (TestP and TestN)
          3. 9.3.1.1.3 Temperature Sensor (TempP, TempN)
          4. 9.3.1.1.4 Supply Measurements (MVDDP, MVDDN)
          5. 9.3.1.1.5 Lead-Off Excitation Signals (LoffP, LoffN)
          6. 9.3.1.1.6 Auxiliary Single-Ended Input
        2. 9.3.1.2 Analog Input
        3. 9.3.1.3 PGA Settings and Input Range
          1. 9.3.1.3.1 Input Common-Mode Range
          2. 9.3.1.3.2 Input Differential Dynamic Range
          3. 9.3.1.3.3 ADC ΔΣ Modulator
          4. 9.3.1.3.4 Reference
      2. 9.3.2 Digital Functionality
        1. 9.3.2.1 Digital Decimation Filter
          1. 9.3.2.1.1 Sinc Filter Stage (sinx / x)
        2. 9.3.2.2 Clock
        3. 9.3.2.3 GPIO
        4. 9.3.2.4 ECG and EEG Specific Features
          1. 9.3.2.4.1 Input Multiplexer (Rerouting the BIAS Drive Signal)
          2. 9.3.2.4.2 Input Multiplexer (Measuring the BIAS Drive Signal)
          3. 9.3.2.4.3 Lead-Off Detection
            1. 9.3.2.4.3.1 DC Lead-Off
            2. 9.3.2.4.3.2 AC Lead-Off (One Time or Periodic)
          4. 9.3.2.4.4 Bias Lead-Off
          5. 9.3.2.4.5 Bias Drive (DC Bias Circuit)
            1. 9.3.2.4.5.1 Bias Configuration with Multiple Devices
    4. 9.4 Device Functional Modes
      1. 9.4.1 Start
        1. 9.4.1.1 Settling Time
      2. 9.4.2 Reset (RESET)
      3. 9.4.3 Power-Down (PWDN)
      4. 9.4.4 Data Retrieval
        1. 9.4.4.1 Data Ready (DRDY)
        2. 9.4.4.2 Reading Back Data
      5. 9.4.5 Continuous Conversion Mode
      6. 9.4.6 Single-Shot Mode
    5. 9.5 Programming
      1. 9.5.1 Data Format
      2. 9.5.2 SPI Interface
        1. 9.5.2.1 Chip Select (CS)
        2. 9.5.2.2 Serial Clock (SCLK)
        3. 9.5.2.3 Data Input (DIN)
        4. 9.5.2.4 Data Output (DOUT)
      3. 9.5.3 SPI Command Definitions
        1. 9.5.3.1  Sending Multi-Byte Commands
        2. 9.5.3.2  WAKEUP: Exit STANDBY Mode
        3. 9.5.3.3  STANDBY: Enter STANDBY Mode
        4. 9.5.3.4  RESET: Reset Registers to Default Values
        5. 9.5.3.5  START: Start Conversions
        6. 9.5.3.6  STOP: Stop Conversions
        7. 9.5.3.7  RDATAC: Read Data Continuous
        8. 9.5.3.8  SDATAC: Stop Read Data Continuous
        9. 9.5.3.9  RDATA: Read Data
        10. 9.5.3.10 RREG: Read From Register
        11. 9.5.3.11 WREG: Write to Register
    6. 9.6 Register Maps
      1. 9.6.1 User Register Description
        1. 9.6.1.1  ID: ID Control Register (address = 00h) (reset = xxh)
        2. 9.6.1.2  CONFIG1: Configuration Register 1 (address = 01h) (reset = 96h)
        3. 9.6.1.3  CONFIG2: Configuration Register 2 (address = 02h) (reset = C0h)
        4. 9.6.1.4  CONFIG3: Configuration Register 3 (address = 03h) (reset = 60h)
        5. 9.6.1.5  LOFF: Lead-Off Control Register (address = 04h) (reset = 00h)
        6. 9.6.1.6  CHnSET: Individual Channel Settings (n = 1 to 8) (address = 05h to 0Ch) (reset = 61h)
        7. 9.6.1.7  BIAS_SENSP: Bias Drive Positive Derivation Register (address = 0Dh) (reset = 00h)
        8. 9.6.1.8  BIAS_SENSN: Bias Drive Negative Derivation Register (address = 0Eh) (reset = 00h)
        9. 9.6.1.9  LOFF_SENSP: Positive Signal Lead-Off Detection Register (address = 0Fh) (reset = 00h)
        10. 9.6.1.10 LOFF_SENSN: Negative Signal Lead-Off Detection Register (address = 10h) (reset = 00h)
        11. 9.6.1.11 LOFF_FLIP: Lead-Off Flip Register (address = 11h) (reset = 00h)
        12. 9.6.1.12 LOFF_STATP: Lead-Off Positive Signal Status Register (address = 12h) (reset = 00h)
        13. 9.6.1.13 LOFF_STATN: Lead-Off Negative Signal Status Register (address = 13h) (reset = 00h)
        14. 9.6.1.14 GPIO: General-Purpose I/O Register (address = 14h) (reset = 0Fh)
        15. 9.6.1.15 MISC1: Miscellaneous 1 Register (address = 15h) (reset = 00h)
        16. 9.6.1.16 MISC2: Miscellaneous 2 (address = 16h) (reset = 00h)
        17. 9.6.1.17 CONFIG4: Configuration Register 4 (address = 17h) (reset = 00h)
  10. 10Applications and Implementation
    1. 10.1 Application Information
      1. 10.1.1 Unused Inputs and Outputs
      2. 10.1.2 Setting the Device for Basic Data Capture
        1. 10.1.2.1 Lead-Off
        2. 10.1.2.2 Bias Drive
      3. 10.1.3 Establishing the Input Common-Mode
      4. 10.1.4 Multiple Device Configuration
        1. 10.1.4.1 Cascaded Mode
        2. 10.1.4.2 Daisy-Chain Mode
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
    1. 11.1 Power-Up Sequencing
    2. 11.2 Connecting the Device to Unipolar (5 V and 3.3 V) Supplies
    3. 11.3 Connecting the Device to Bipolar (±2.5 V and 3.3 V) Supplies
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Related Links
    3. 13.3 Receiving Notification of Documentation Updates
    4. 13.4 Community Resources
    5. 13.5 Trademarks
    6. 13.6 Electrostatic Discharge Caution
    7. 13.7 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

13 Device and Documentation Support

13.1 Documentation Support

13.1.1 Related Documentation

For related documentation see the following:

13.2 Related Links

The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to order now.

Table 31. Related Links

PARTS PRODUCT FOLDER ORDER NOW TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY
ADS1299 Click here Click here Click here Click here Click here
ADS1299-4 Click here Click here Click here Click here Click here
ADS1299-6 Click here Click here Click here Click here Click here

13.3 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

13.4 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

13.5 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

13.6 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

13.7 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.