SBOK082 December 2024 TRF0208-SEP
A step-stress (20krad(Si), 30krad(Si), 50krad(Si)) test method was used to determine the TID hardness level. That is, after a predetermined TID level was reached, an electrical test was performed on a given sample of parts to verify that the units are within specified the VID electrical test limits. MIL-STD-883, Test Method 1019, Condition A was used in this case.
Table 2-1 and Table 2-2 list the serialized samples that were used during the RHA characterization.
| HDR = 263rad(Si) / s | ||
|---|---|---|
| Total Samples: Five Unbiased /TID Level | ||
| Exposure Levels: | ||
| 20krad(Si) | 30krad(Si) | 50krad(Si) |
| 6U, 7U, 8U, 9U, 10U | 16U, 17U, 18U, 19U, 20U | 26U, 27U, 28U, 29U, 30U |
| HDR = 263rad(Si) / s | ||
|---|---|---|
| Total Samples: Five biased / TID level | ||
| Exposure Levels: | ||
| 20krad(Si) | 30krad(Si) | 50krad(Si) |
| 1, 2, 3, 4, 5 | 11, 12, 13, 14, 15 | 21, 22, 23, 24, 25 |