SBOK094 December   2024 TRF0208-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose Characterization Test Results
    1. 3.1 Total Ionizing Dose RHA Characterization Summary Results
  7. 4Applicable and Reference Documents
    1. 4.1 Reference Documents
  8. 5HDR Total Ionizing Dose Report

1.2 Device Details

Table 1-1 lists the device information used in the TID HDR characterization.

Table 1-1 Device and Exposure Details
TID HDR Details: up to 100 krad(Si)
TI Device Number5962R2420201PXE (TRF0208-SP)
PackageWQFN-FCRLF (RPV)
TechnologyBICMOS
Die Lot Number4031088
A/T Lot Number / Date Code4325705 / 47A3YTI
Quantity TestedHDR:32
Lot Accept/RejectAll levels tested and passed up to 100 krad(Si) (HDR)
HDR Radiation FacilityTexas Instruments, Dallas
HDR Dose Level30 krad(Si), 50 krad(Si), 100 krad(Si)
HDR Dose Rate263 rad(Si)/s
HDR Radiation SourceGamma rays provided by Hopewell GR420 Co60 source. Dosimetry performed by Hopewell via GEX using GEX Alanine dosimeters
Irradiation TemperatureAmbient, room temperature controlled to 4°C ± 6°C per MILSTD-883 and MIL-STD-750