SBOK100 February   2025 SN54SC8T240-SEP , SN54SC8T244-SEP , SN54SC8T541-SEP , SN54SC8T9541-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Single-Event Transients (SET)
    3. 5.3 Event Rate Calculations
  9. 6Summary
  10. 7References

1 Overview

The SN54SC8T541-SEP is a radiation-tolerant, 1.2V to 5.5V octal buffers and line drivers with 3-state outputs and logic level shifter. The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2V input to 1.8V output or 1.8V input to 3.3V output). In addition, the 5V tolerant input pins enable down translation (for example, 3.3V to 2.5V output).

For more information, see the SN54SC8T541-SEP product page.

Table 1-1 Overview Information
DescriptionDevice Information
TI Part NumberSN54SC8T541-SEP
Orderable Part NumberSN54SC8T541MPWTSEP
VID Number

V62/25632

Device FunctionRadiation-tolerant, 1.2V to 5.5V, Octal Buffers and Line Drivers With 3-State Outputs and Logic Level Shifter
TechnologyLBC9
Exposure FacilityFacility for Rare Isotope Beams (FRIB) at Michigan State University – FRIB Single Event Effects (FSEE) Facility
Heavy Ion Fluence per Run1 × 107 ions / cm2
Irradiation Temperature25°C (for SET testing) and 125°C (for SEL testing)