8 Revision History
Changes from Revision A (February 2024) to Revision B (January 2026)
- Added description of device flow information in
Specifications
Go
- Added all chip site origins (CSO) condition to the typical test conditions in the Electrical Characteristics
Go
- Added different fabrication process specifications for short-circuit current in the Electrical Characteristics
Go
- Added different fabrication process specifications for slew rate in the Electrical Characteristics
Go
- Added different fabrication process specifications for overload recovery in the Electrical Characteristics
Go
- Added all chip site origins (CSO) condition to the typical test
conditions in the Typical Characteristics
Go
- Added "CSO:SHE" to Gain vs Frequency, Power Supply Rejection vs
Frequency, Output Voltage Swing vs Output Current, Quiescent and Short-Circuit
Current vs Temperature, and Large-Signal Step Response curves in the Typical
Characteristics
Go
- Added Gain vs Frequency, Power Supply Rejection vs Frequency,
Output Voltage Swing vs Output Current, Quiescent Current vs Temperature,
Short-Circuit Current vs Temperature, and Large-Signal Step Response curves for
CSO: TID in the Typical Characteristics
Go
- Added Part Number flow information table to the Device
Nomenclature
Go
Changes from Revision * (November 1996) to Revision A (February 2024)
- Updated the numbering format for tables, figures, and
cross-references throughout the documentGo
- Added the ESD Ratings, Recommended Operating
Conditions, Thermal Information, Application and
Implementation, Typical Applications, Device and Documentation
Support, and Mechanical, Packaging, and Orderable Information
sectionsGo
- Deleted DIP package and associated content from data
sheetGo
- Updated Features bulletsGo
- Updated Applications bulletsGo
- Added Pin Functions tableGo
- Added dual supply specification to Absolute Maximum Ratings
Go
- Changed output short-circuit from "ground" to "VS / 2" in Absolute Maximum Ratings
Go
- Added VREF = 0V, VCM = VS / 2, and G = 1 to test conditions in Electrical Characteristics and Typical Characteristics for clarityGo
- Changed "Offset Voltage vs Temperature" to "Offset voltage drift" and added TA = –40℃ to +85℃ test condition for clarityGo
- Changed "Offset Voltage vs Time" to "Long-term stability" for clarityGo
- Changed "Offset Voltage vs Power Supply" to Power-supply rejection ratio for clarityGo
- Changed voltage noise typical value at 1kHz from 65nV/√Hz to 75nV/√Hz
Go
- Changed "Gain Error vs Temperature" to "Gain error drift" and added TA = –40℃ to +85℃ test condition for clarityGo
- Changed "Voltage, Positive" to "Positive output voltage swing" and from "Voltage, Negative" to "Negative output voltage swing"Go
- Added test condition of "Continuous to VS / 2" to short-circuit current for clarityGo
- Changed short-circuit current typical value from ±12mA to +6mA/–15mAGo
- Deleted power supply voltage range typical value of ±15VGo
- Moved voltage range, operating temperature range, and thermal resistance from Electrical Characteristics to Recommended Operating Conditions and Thermal Information
Go
- Changed quiescent current typical value from ±160µA to ±175µA and maximum value from ±185µA to ±230µAGo
- Added VREF = VS / 2, VCM = VS / 2, and G = 1 to test conditions in Electrical Characteristics: VS = 5V for clarityGo
- Changed "Offset Voltage vs Temperature" to "Offset voltage drift" and added TA = –40℃ to +85℃ test condition for clarityGo
- Added (V–) to negative output voltage swing minimum and typical valuesGo
- Deleted power supply voltage range typical value of +5VGo
- Moved voltage range from Electrical Characteristics: VS = 5V to Recommended Operating Conditions
Go
- Changed quiescent current typical value from ±155µA to ±175µA and maximum value from ±185µA to ±230µAGo