SCASE80A September   2025  – January 2026 TPUL2T323-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Timing Characteristics
    7.     13
    8. 5.7 Switching Characteristics
    9. 5.8 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
      1. 7.1.1 State Machine Description
        1. 7.1.1.1 Ready
        2. 7.1.1.2 RC Measurement Cycle
          1. 7.1.1.2.1 Discharge
          2. 7.1.1.2.2 Monitor
          3. 7.1.1.2.3 Timer Count Decision
          4. 7.1.1.2.4 Cycle Count Decision
          5. 7.1.1.2.5 Increment Cycle Counter
          6. 7.1.1.2.6 Reset Timer Counter
          7. 7.1.1.2.7 Save Timer Count
        3. 7.1.1.3 Digital Timer Cycle
          1. 7.1.1.3.1 Reset Timer Counter
          2. 7.1.1.3.2 Delay
          3. 7.1.1.3.3 Increment Cycle Counter
          4. 7.1.1.3.4 Cycle Count Decision
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Naming Convention
      2. 7.3.2  Retriggerable One-Shot
      3. 7.3.3  Extended RC Timed One-Shot
      4. 7.3.4  Balanced CMOS Push-Pull Outputs
      5. 7.3.5  CMOS Schmitt-Trigger Inputs
      6. 7.3.6  Latching Logic with Known Power-Up State
      7. 7.3.7  Partial Power Down (Ioff)
      8. 7.3.8  Reduced Input Threshold Voltages
      9. 7.3.9  Wettable Flanks
      10. 7.3.10 Clamp Diode Structure
    4. 7.4 Device Functional Modes
      1. 7.4.1 Off-State Operation
      2. 7.4.2 Startup Operation
      3. 7.4.3 On-State Operation
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application - Edge Detector
      1. 8.2.1 Design Requirements
        1. 8.2.1.1 Timing Components
        2. 8.2.1.2 Input Considerations
        3. 8.2.1.3 Output Considerations
        4. 8.2.1.4 Power Considerations
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Typical Application - Delayed Pulse Generator
      1. 8.3.1 Application Curves
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

9.5 Electrostatic Discharge Caution

TPUL2T323-Q1 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.