SCLS130H December   1982  – February 2025 SN54HC244 , SN54HC244-SP , SN74HC244

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Electrical Characteristics – SN54HC244
    7. 5.7  Electrical Characteristics – SN74HC244
    8. 5.8  Switching Characteristics
    9. 5.9  Switching Characteristics – CL = 50 pF
    10. 5.10 Switching Characteristics – CL = 150 pF
    11. 5.11 Typical Characteristic
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Standard CMOS Inputs
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout Guidelines
      1. 8.4.1 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Links
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

1 Features

  • Wide operating voltage range of 2V to 6V
  • High-current outputs drive up to 15 LSTTL loads
  • 3-state outputs drive bus lines or buffer memory address registers
  • Low power consumption: ICC, 80µA (maximum)
  • Typical tpd = 11ns
  • ±6mA output drive at 5V
  • Low input current of 1µA (maximum)
  • On products compliant to MIL-PRF-38535,
    all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.