SCLS780C June   2020  – October 2026 SN74HCS266

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Open-Drain CMOS Outputs
      2. 7.3.2 CMOS Schmitt-Trigger Inputs
      3. 7.3.3 Clamp Diode Structure
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
        1. 8.2.1.1 Power Considerations
        2. 8.2.1.2 Input Considerations
        3. 8.2.1.3 Output Considerations
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Related Links
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

10 Revision History

Changes from March 19, 2026 to September 29, 2026 (from Revision B (March 2026) to Revision C (October 2026))

  • Changed VT+ limits at 2V VCC from 1.18V (min), 1.3V (max) to 1.13V (min), 1.37V (max) Go
  • Added VT+ typical values at 2V VCC Go
  • Changed VT+ limits at 4.5V VCC from 2.39V (min), 2.58V (max) to 2.31V (min), 2.66V (max) Go
  • Added VT+ typical values at 4.5V VCC Go
  • Changed VT+ limits at 6V VCC from 3.11V (min), 3.32V (max) to 2.99V (min), 3.44V (max) Go
  • Added VT+ typical values at 6V VCC Go
  • Changed VT- limits at 2V VCC from 0.61V (min), 0.66V (max) to 0.55V (min), 0.71V (max)Go
  • Added VT- typical values at 2V VCC Go
  • Changed VT- limits at 4.5V VCC from 1.31V (min), 1.42V (max) to 1.21V (min), 1.50V (max) Go
  • Added VT- typical values at 4.5V VCC Go
  • Changed VT- limits at 6V VCC from 1.72V (min), 1.87V (max) to 1.56V (min), 1.99V (max)Go
  • Added VT- typical values at 6V VCC Go
  • Changed ΔVT limits at 2V VCC from 0.2V (min), 1.0V (max) to 0.55V (min), 0.67V (max)Go
  • Added ΔVT typical values at 2V VCC Go
  • Changed ΔVT limits at 4.5V VCC from 1.04V (min), 1.21V (max) to 0.94V (min), 1.27V (max)Go
  • Added ΔVT typical values at 4.5V VCC Go
  • Changed ΔVT limits at 6V VCC from 1.34V (min), 1.49V (max) to 1.20V (min), 1.57V (max)Go
  • Added ΔVT typical values at 6V VCC Go

Changes from October 1, 2020 to March 19, 2026 (from Revision A (October 2020) to Revision B (March 2026))

  • Updated the numbering format for tables, figures and cross-references throughout the document.Go
  • Changed VT+ limits at 2V VCC from 0.7V (min), 1.5V (max) to 1.18V (min), 1.3V (max) Go
  • Changed VT+ limits at 4.5V VCC from 1.7V (min), 3.15V (max) to 2.39V (min), 2.58V (max) Go
  • Changed VT+ limits at 6V VCC from 2.1V (min), 4.2V (max) to 3.11V (min), 3.32V (max) Go
  • Changed VT- limits at 2V VCC from 0.3V (min), 1.0V (max) to 0.61V (min), 0.66V (max)Go
  • Changed VT- limits at 4.5V VCC from 0.9V (min), 2.2V (max) to 1.31V (min), 1.42V (max) Go
  • Changed VT- limits at 6V VCC from 1.2V (min), 3.0V (max) to 1.72V (min), 1.87V (max)Go
  • Changed ΔVT limits at 2V VCC from 0.2V (min), 1.0V (max) to 0.55V (min), 0.67V (max)Go
  • Changed ΔVT limits at 4.5V VCC from 0.4V (min), 1.4V (max) to 1.04V (min), 1.21V (max)Go
  • Changed ΔVT limits at 6V VCC from 0.6V (min), 1.6V (max) to 1.34V (min), 1.49V (max)Go
  • Improved clarity of functionality for the deviceGo

Changes from Revision * (June 2020) to Revision A (October 2020)

  • Updated the numbering format for tables, figures and cross-references throughout the document.Go
  • Improved clarity of functionality for the deviceGo