SDAA150 December   2025 ADS124S06 , ADS124S08

 

  1.   1
  2.   Abstract
  3. 1Circuit Design and Test System
    1. 1.1 Design Overview
    2. 1.2 Overview of EMC Test Board for RTD Measurements
      1. 1.2.1 Input Configurations and ADC Settings
        1. 1.2.1.1 Configuration and settings for a 3-wire RTD measurement with a low-side reference
        2. 1.2.1.2 Configuration and settings for a 3-wire RTD measurement with a high-side reference
      2. 1.2.2 Temperature Error - RTD Measurement
        1. 1.2.2.1 Calculating RTD temperature from RTD resistance
        2. 1.2.2.2 Calculating the temperature error from RTD measurements
        3. 1.2.2.3 Experimental setup and results
    3. 1.3 Overview of EMC Test Board for TC Measurements
      1. 1.3.1 Input Configurations and ADC Settings
        1. 1.3.1.1 Input Configurations
        2. 1.3.1.2 Thermocouple Characteristics and ADC Settings
      2. 1.3.2 Temperature Error - TC Measurement
        1. 1.3.2.1 Calculating temperature from TC thermoelectric voltage
        2. 1.3.2.2 Calculating the temperature error from TC measurements
        3. 1.3.2.3 Experimental setup and results
    4. 1.4 Circuit Design Considerations for EMC compliance
      1. 1.4.1 Analog Input Protection
      2. 1.4.2 Anti-aliasing Filter
      3. 1.4.3 High-voltage Capacitors on Every Input Connector Pin
      4. 1.4.4 High-voltage Capacitors and Resistors for Discharging Path
      5. 1.4.5 Series Resistors on Digital Signals
      6. 1.4.6 Digital Isolation
      7. 1.4.7 Power Supply and Protection
    5. 1.5 PCB Layout Consideration for EMC compliance
      1. 1.5.1 PCB Layer Stack-up and Ground Plane
      2. 1.5.2 Avoiding a Long Return Path
      3. 1.5.3 Avoiding 90-degree Bends in PCB Traces
      4. 1.5.4 Using Guard Ring to Isolate Interference Signals
      5. 1.5.5 Decoupling Capacitors
      6. 1.5.6 Differential Signal Routing
      7. 1.5.7 Stitching Vias
      8. 1.5.8 Layout for Isolation Barrier
      9. 1.5.9 Component Placement
    6. 1.6 Test System
  4. 2Test Details and Results
    1. 2.1 Standards and Test Criteria
    2. 2.2 Electrostatic Discharge (ESD)
    3. 2.3 Radiated Immunity (RI)
    4. 2.4 Electrical Fast Transients (EFT)
    5. 2.5 Surge Immunity (SI)
    6. 2.6 Conducted Immunity (CI)
  5. 3Schematic, PCB Layout and Bill of Materials
    1. 3.1 Schematic - RTD EMC Test Board
    2. 3.2 Schematic - TC EMC Test Board
    3. 3.3 PCB Layout - RTD EMC Test Board (4-Layer)
    4. 3.4 PCB Layout - RTD EMC Test Board (2-Layer)
    5. 3.5 PCB Layout - TC EMC Test Board (4-Layer)
    6. 3.6 PCB Layout - TC EMC Test Board (2-Layer)
    7. 3.7 Bill of Materials - RTD EMC Test Board
    8. 3.8 Bill of Materials - TC EMC Test Board
  6. 4Summary
  7. 5References

Stitching Vias

Stitching vias can improve signal integrity, reduce impedance and inductance, minimize noise and crosstalk, and also enhance EMI shielding. The EMC test boards employ stitching vias for several different purposes, including:

Enhancing high speed signal integrity and reliability:

The serial clock signal required by many ADCs can be as high as 50MHz. Stitching vias can significantly enhance signal integrity and reliability for high-speed signals by providing a low impedance ground return path, reducing ground ringing and crosstalk. Keep high-speed signals on the same layer as the ADC if possible. Use a single stitching via or stitching via array if a high-speed signal must be routed between different layers. Figure 1-26 shows the side view of a stitching via on a 4-layer circuit board.

 Side View of Stitching Via for High-Speed SignalFigure 1-26 Side View of Stitching Via for High-Speed Signal

The EMC test boards route the SCLK trace on the top layer between the ADC and the digital isolator. The SCLK trace then continues from the digital isolator and connector J1 to the controller board on the top layer. Therefore, this design does not require stitching vias for the SCLK signal. Figure 1-27 shows stitching via examples for the DIN and DOUT signals on the RTD EMC test boards.

 Stitching Vias for SignalsFigure 1-27 Stitching Vias for Signals.

Layer transition and ground pour connection:

Use stitching vias transitioning between layers to improve signal integrity by providing a consistent reference plane and a low impedance return path for signals. Stitching vias are also used to connect ground pours across multiple layers and ensure minimum impedance for any return current propagating along the PCB reference plane. Figure 1-28 shows the layer transition and ground connection design example on the 2-layer RTD EMC test board.

 Stitching Vias for Layer Transition and Ground ConnectionFigure 1-28 Stitching Vias for Layer Transition and Ground Connection.