SFFS145 November 2021 TCAN1162-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the TCAN1162-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TCAN1162-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TCAN1162-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | Device will enter dominant timeout mode. Unable to transmit data from processor to CAN bus | B |
GND | 2 | None | D |
VFLT | 3 | Internal power rail held to ground, which results in unpowered device and high ISUP current. No communication with device or CAN bus possible | B |
RXD | 4 | Transceiver output biased dominant. Unable to send data from CAN bus to processor | B |
VIO | 5 | Digital pins unpowered, high IIO current. No communication between device and processor possible | B |
TS | 6 | Transceiver status output held at ground. Unable to signal ready transceiver to processor | B |
INH | 7 | INH will not function, excessive VSUP current and not able to perform power enable function | B |
NC | 8 | This pin should be left floating or pulled to ground | D |
WAKE | 9 | Will not be able to transition to high, which will not allow device to recognize a local wake up function | B |
VSUP | 10 | Device unpowered, high ISUP current | B |
NC | 11 | This pin should be left floating or pulled to ground | D |
CANL | 12 | VO(REC) spec violated. Degraded EMC performance | C |
CANH | 13 | Device cannot drive dominant to the bus, no communication possible | B |
nSLP | 14 | Part held in sleep mode. Part will not wake up, resulting in CAN bus communication failure | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | Unable to trtansmit data from processor to CAN bus | B |
GND | 2 | Device is unpowered | B |
VFLT | 3 | Degraded EMC performance with no capacitor | C |
RXD | 4 | Unable to send data from CAN bus to processor | B |
VIO | 5 | Digital pins unpowered. No communication between device and processor possible | B |
TS | 6 | Transceiver status output held at ground. Unable to signal ready transceiver to processor | B |
INH | 7 | INH will not be able to perform system power enable functrion | B |
NC | 8 | This pin should be left floating or connected to ground | D |
WAKE | 9 | Will not be able to transition, which will not allow device to recognize a local wake up function | B |
VSUP | 10 | Device is unpowered | B |
NC | 11 | This pin should be left floating or pulled to ground | D |
CANL | 12 | Device cannot drive dominant to the bus, unable to communicate | B |
CANH | 13 | Device cannot drive dominant to the bus, unable to communicate | B |
nSLP | 14 | Processor will be unable to put the device into low-power sleep mode | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
TXD | 1 | GND | Device will enter dominant time out mode. Unable to transmit data from processor to CAN bus | B |
GND | 2 | VFLT | Internal power rail held to ground, which results in unpowered device and high ISUP current. No communication with device or CAN bus possible. | B |
VFLT | 3 | RXD | RXD output biased recessive, unable to communication bus data to processor | B |
RXD | 4 | VIO | RXD output biased recessive, unable to communication bus data to processor | B |
VIO | 5 | TS | Transceiver status output held at VIO. Unable to signal ready transceiver to processor | B |
TS | 6 | INH | Absolute maximum violation, pin may be damaged. Unable to communicate from transceiver status to processor | A |
NC | 8 | WAKE | Absolute maximum violation on the NC pin, possible damage or unexpected behavior of device | A |
WAKE | 9 | VSUP | Absolute maximum violation, WAKE pin may be damaged | A |
VSUP | 10 | nRST | Absolute maximum violation, nRST pin may be damaged | A |
NC | 11 | CANL | This pin should be left floating or pulled to ground. Potential for unexpected device behavior | B |
CANL | 12 | CANH | Bus biased recessive, no communication possible. IOS current may be reached on CANH/CANL | B |
CANH | 13 | nSLP | Device could be put to sleep when bus is recessive. No communication possible | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | Absolute maximum violation, pin may be damaged. Unable to communicate from processor to CAN bus | A |
GND | 2 | Device unpowered, high ISUP current, may damage device | A |
VFLT | 3 | Absolute maximum violation, device may be damaged. | A |
RXD | 4 | Absolute maximum violation, pin may be damaged. Unable to communicate from CAN bus to processor | A |
VIO | 5 | Absolute maximum violation, pin may be damaged. | A |
TS | 6 | Absolute maximum violation, pin may be damaged. | A |
INH | 7 | INH will be biased on and will not be able to turn off | B |
NC | 8 | Absolute maximum violation on the NC pin, possible damage or unexpected behavior of device | A |
WAKE | 9 | Processor will be unable to toggle wake pin. No local wake possible. | B |
VSUP | 10 | None | D |
NC | 11 | Absolute maximum violation, pin may be damaged or unexpected behavior of device | A |
CANL | 12 | RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached | B |
CANH | 13 | VO(REC) spec violated. May degrade EMC performance | C |
nSLP | 14 | Absolute maximum violation, pin may be damaged. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
TXD | 1 | TXD will be held high, no communication from processor to CAN bus possible | B |
GND | 2 | Device unpowered, communication not possible | B |
VFLTR | 3 | Excessive current from internal rail, may enter thermal shutdown | B |
RXD | 4 | RXD will be held high, no communication from CAN bus to processor possible | B |
VIO | 5 | None | D |
TS | 6 | Held high, unable to signal transceiver state to processor | B |
INH | 7 | Absolute maximum violation, device may be damaged | A |
NC | 8 | Pin not held low or floating, possible unexpected behavior of device | B |
WAKE | 9 | Processor will be unable to toggle wake pin. No local wake possible | B |
VSUP | 10 | Absolute maximum violation, device may be damaged | A |
NC | 11 | Pin not held low or floating, possible unexpected behavior of device | B |
CANL | 12 | RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached | B |
CANH | 13 | VO(REC) spec violated. May degrade EMC performance | C |
nSLP | 14 | Held high, unable to put device to sleep | B |