SFFS991 September 2024 TMUX1208-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a failure mode analysis (FMA) for the pins of the TMUX1208-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to supply (see Table 4-5)
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Table 4-1 TI Classification of Failure
Effects
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the TMUX1208-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TMUX1208-Q1 data sheet.
Figure 4-1 Pin DiagramTable 4-2 Pin FMA for Device Pins
Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| NC | 1 | No effect, unconnected pin. | D |
| S1 | 2 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S2 | 3 | Corruption of the signal passed on to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S3 | 4 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S4 | 5 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| D | 6 | Corruption of the signal passed onto the S pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S8 | 7 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S7 | 8 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S6 | 9 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S5 | 10 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 11 | Device is not powered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is plausible. | A |
| GND | 12 | No effect, normal operation. | D |
| A2 | 13 | Address stuck low, cannot control switch states. | B |
| A1 | 14 | Address stuck low, cannot control switch states. | B |
| A0 | 15 | Address stuck low, cannot control switch states. | B |
| EN | 16 | Address stuck low, cannot control switch states. | B |
Table 4-3 Pin FMA for Device Pins
Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| NC | 1 | No effect, unconnected pin. | D |
| S1 | 2 | Corruption of the signal passed to the D pin. | B |
| S2 | 3 | Corruption of the signal passed to the D pin. | B |
| S3 | 4 | Corruption of the signal passed to the D pin. | B |
| S4 | 5 | Corruption of the signal passed to the D pin. | B |
| D | 6 | Corruption of the signal passed to the S pins. | B |
| S8 | 7 | Corruption of the signal passed to the D pin. | B |
| S7 | 8 | Corruption of the signal passed to the D pin. | B |
| S6 | 9 | Corruption of the signal passed to the D pin. | B |
| S5 | 10 | Corruption of the signal passed to the D pin. | B |
| VDD | 11 | Device is not powered. Device is not functional. | B |
| GND | 12 | Device not powered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| A2 | 13 | Control of the address pin is lost, cannot control switch. | B |
| A1 | 14 | Control of the address pin is lost, cannot control switch. | B |
| A0 | 15 | Control of the address pin is lost, cannot control switch. | B |
| EN | 16 | Control of the address pin is lost, cannot control switch. | B |
Table 4-4 Pin FMA for Device Pins
Short-Circuited to Adjacent Pin
| Pin Name | Pin No. |
Shorted to |
Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| NC | 1 | S1 | No connect pin electrically floating, no effect. | D |
| S1 | 2 | S2 | Possible corruption of the signal passed to the D pin. | B |
| S2 | 3 | S3 | Possible corruption of the signal passed to the D pin. | B |
| S3 | 4 | S4 | Not considered, corner pin. | D |
| S4 | 5 | D | Possible corruption of the signal passed to the SX and D pin. | B |
| D | 6 | S8 | Possible corruption of the signal passed to the SX and D pin. | B |
| S8 | 7 | S7 | Possible corruption of the signal passed to the D pin. | B |
| S7 | 8 | S6 | Not considered, corner pin. | D |
| S6 | 9 | S5 | Possible corruption of the signal passed to the D pin. | B |
| S5 | 10 | VDD | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | B |
| VDD | 11 | GND |
Device likely receives no power. Possible damage to VDD and GND pin. |
A |
| GND | 12 | A2 | Control of the switch state is lost. | B |
| A2 | 13 | A1 | Not considered, corner pin. | D |
| A1 | 14 | A0 | Control of the switch state is lost. | B |
| A0 | 15 | EN | Control of the switch state is lost. | B |
| EN | 16 | NC | Not considered, corner pin. | D |
Table 4-5 Pin FMA for Device Pins
Short-Circuited to Supply
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| NC | 1 | No effect, unconnected pin. | D |
| S1 | 2 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible | A |
| S2 | 3 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S3 | 4 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S4 | 5 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| D | 6 | Corruption of the signal passed to the S pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S8 | 7 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S7 | 8 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S6 | 9 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S5 | 10 | Corruption of the signal passed to the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 11 | No effect, normal operation | D |
| GND | 12 | Device is not powered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is plausible. | A |
| A2 | 13 | Address stuck low, cannot control switch states. | B |
| A1 | 14 | Address stuck low, cannot control switch states. | B |
| A0 | 15 | Address stuck low, cannot control switch states. | B |
| EN | 16 | Address stuck low, cannot control switch states. | B |