SFFSAU3 August 2026 LM851772-Q1
This section provides a failure mode analysis (FMA) for the pins of the LM851772-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the LM851772-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the LM851772-Q1 datasheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | When the VCC1 pin is disabled through logic and connected through a resistor to GND: There is no impact to the device. | D |
| When the VCC1 pin is disabled through logic and connected to the VCC2 pin: The device does not start. | B | ||
| When the VCC1 pin is enabled: VCC1 operates in current limit at 0V. | B | ||
| SS/ATRK | 2 | The device regulates the output voltage to 0V. | B |
| SYNC | 3 | When the SYNC pin is not used and connected to GND: There is no effect to the device. | D |
| When the SYNC pin is not used and connected to the VCC2 pin: The device does not start. | B | ||
| When the SYNC pin is configured as the clock input signal: There is no SYNC functionality. | C | ||
| When the SYNC pin is configured as the clock output signal: There is no SYNC signal available to the other phase. | C | ||
| DTRK | 4 | When the DTRK pin is used: There is a loss of the functionality of DTRK, the device regulates to the internal reference. | B |
| When the DTRK pin is not used and connected to GND: There is no effect to the device. | D | ||
| When the DTRK pin is not used and connected to the VCC2 pin: The device does not start. | B | ||
| SDA | 5 | Communication with the device is not possible. | B |
| SCL | 6 | Communication with the device is not possible. | B |
| MODE | 7 | Power save mode is enabled. | C |
| When the MODE pin is connected to the VCC2 pin: The device does not start. | B | ||
| CFG2 | 8 | When the CFG2 pin is used at nRST rise: There is a possible configuration change from the expected configuration to configuration 1, see the CFG2 Pin (R2D-CH2) Configuration Overview table in the datasheet. | C |
| When the CFG2 pin is used after start-up: There is no effect to the device. | D | ||
| ADDR(CFG1) | 9 | When the ADDR(CFG1) pin is shorted at nRST rise: I2C is enabled, the device address is set to 0x6A, and the slope compensation is set according configuration 1, see the ADDR Pin (R2D-CH1 Configuration Overview table in the datasheet. | C |
| When the ADDR(CFG1) pin is shorted after start-up: There is no effect to the device. | D | ||
| CDC | 10 | When the CDC pin is configured as current monitor: There is no output signal. | B |
| When the CDC pin is configured as cable drop compensation: There is no load current dependent offset on the output voltage of the converter. | B | ||
| When the CDC pin is disabled: There is no impact to the device. | D | ||
| nFLT/nINT | 11 | The pin permanently indicates a fault or interrupt. | B |
| RT | 12 | The converter switches at maximum frequency (≅2.5MHz). | B |
| COMP | 13 | If the MODE pin is low: The converter does not switch. | B |
| If the MODE pin is high: The inductor current goes to the negative current limit until IVP is triggered. | B | ||
| FB/SEL_intFB | 14 | With external feedback (FB): The output voltage rises until the device triggers overvoltage protection. | B |
| When the internal FB is used, and the pin is connected to the VCC2 pin: The device does not start. | B | ||
| AGND | 15 | There is no effect to the device. The device operates normally. | D |
| ILIMCOMP | 16 | The pin is used: The current loop is unstable, or the average current limit is not available. | C |
| The pin is connected to the VCC2 pin: The device does not switch. | B | ||
| AGND | 17 | There is no effect to the device. The device operates normally. | D |
| VOUT | 18 | The converter operates in peak or average current limit and the output voltage is shorted to GND. | B |
| ISNSN | 19 | The differential voltage on the sense amplifier is too high. Potential damage to the pin. | A |
| ISNSP | 20 | The differential voltage on the sense amplifier is too high. Potential damage to the pin. | A |
| CSB | 21 | The differential voltage on the sense amplifier is too high. Potential damage to the pin. | A |
| CSA | 22 | The differential voltage on the sense amplifier is too high. Potential damage to the pin. | A |
| SW1 | 23 | There is no output voltage. Potential damage to the device. | A |
| HO1 | 24 | There is no output voltage. The buck high-side FET is off. | B |
| HB1 | 25 | There is no supply for the gate driver. The device is in standby (BOOT_UV). | B |
| NC | 26 | There is no effect to the device. The device operates normally. | D |
| LO1 | 27 | The operation is non-synchronous in buck-mode and partially in buck-boost mode. Potential damage to the external FET due to power dissipation. | C |
| PGND | 28 | There is no effect to the device. The device operates normal. | D |
| VCC2 | 29 | The device does not start. | B |
| LO2 | 30 | The boost low-side FET is always off. There is no boost operation. | C |
| HB2 | 31 | There is no supply for the gate driver. The device is in standby (BOOT_UV). | B |
| HO2 | 32 | The operation is non-synchronous in boost-mode and partially in buck-boost mode. Potential damage to the external FET due to power dissipation. | C |
| SW2 | 33 | There is no output voltage. Potential damage to the device. | A |
| NC | 34 | There is no effect to the device. The device operates normal. | D |
| DRV1 | 35 | When DRV1 is used: There is no system output. | B |
| When DRV1 is not used: There is no effect to the device. | D | ||
| BIAS | 36 | There is no effect to the device. The efficiency of the converter is potentially reduced, or the thermal shutdown triggers. | C |
| EN/UVLO | 37 | The device is in shutdown or standby. | B |
| nRST | 38 | The device is in shutdown. | B |
| NC | 39 | There is no effect to the device. The device operates normal. | D |
| VIN | 40 | The device is in shutdown or standby. | B |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | When the VCC1 pin is disabled: There is no impact to the device. | D |
| When the VCC1 pin is enabled: VCC1 oscillates. Potential damage to the device. | A | ||
| SS/ATRK | 2 | There is a rapid start-up with potentially high inrush current to the converter. | C |
| SYNC | 3 | Unstable switching frequency is possible. | C |
| DTRK | 4 | Erratic operation is possible. | B |
| SDA | 5 | Communication with the device is not possible. | B |
| SCL | 6 | Communication with the device is not possible. | B |
| MODE | 7 | PSM/FPWM is undefined. | C |
| CFG2 | 8 | When the open happens before nRST rise: At nRST rise, the configuration of the device is undefined. | C |
| When the CFG2 pin open happens after start-up: There is no effect to the device. | D | ||
| ADDR (CFG1) | 9 | When the ADDR(CFG1) pin open happens before nRST rise: At nRST rise, the address and configuration of the device is undefined. | C |
| When the ADDR(CFG1) pin open happens after start-up: There is no effect to the device. | D | ||
| CDC | 10 | When the CDC pin is configured as current monitor: There is no signal to the system. | C |
| When the CDC pin is configured as cable drop compensation: The maximum offset on the output is undefined and independent of the load current. | B | ||
| When the CDC pin is disabled: There is no impact to the device. | D | ||
| nFLT/nINT | 11 | The pin does not indicate a fault or interrupt. | B |
| RT | 12 | The lowest switching frequency is selected and the converter is potentially unstable. | C |
| COMP | 13 | The voltage loop is unstable. Potential damage to external components or the device. | A |
| FB/SEL_intFB | 14 | The output voltage is regulated to the overvoltage protection (OVP) level or 0V. | B |
| AGND | 15 | Increased current flow at the internal AGND/PGND connection. The operation is potentially erratic. Potential damage to the device. | A |
| ILIMCOMP | 16 | The current loop is unstable. | C |
| AGND | 17 | Increased current flow at the internal AGND/PGND connection. The operation is potentially erratic. Potential damage to the device. | A |
| VOUT | 18 | With an internal FB divider: There is no regulation of the output voltage. Potential damage to external components or the device. | A |
| With an external FB divider: There is no overvoltage protection (OVP), and no slope compensation. Potential unstable current loop. | B | ||
| ISNSN | 19 | If the average current function is not used, there is no effect to the device. | D |
| There is no average current limit function. | B | ||
| ISNSP | 20 | If the average current function is not used, there is no effect to the device. | D |
| There is no average current limit function. | B | ||
| CSB | 21 | There is erratic switching behavior. There is a loss of regulation. Potential damage to the device or external components. | A |
| CSA | 22 | There is erratic switching behavior. There is a loss of regulation. Potential damage to the device or external components. | A |
| SW1 | 23 | There is a loss of operation or regulation, or the device turns off. | B |
| HO1 | 24 | There is no output voltage. The buck high-side FET is off. | B |
| HB1 | 25 | There is no supply for the gate driver. The device is in standby (BOOT_UV). | B |
| NC | 26 | There is no effect to the device. The device operates normal. | D |
| LO1 | 27 | The operation is non-synchronous in buck-mode and partially in buck-boost mode. Potential damage to the external FET due to power dissipation. | C |
| PGND | 28 | Increased current flow at the internal AGND/PGND connection. The operation is potentially erratic. Potential damage to the device. | A |
| VCC2 | 29 | The internal supply us unstable. The operation is erratic. | B |
| LO2 | 30 | The boost low-side FET is always off, no boost operation. | B |
| HB2 | 31 | There is no supply for the gate driver. The device is in standby (BOOT_UV). | B |
| HO2 | 32 | The operation is non-synchronous in boost-mode and partially in buck-boost mode. Potential damage to the external FET due to power dissipation. | C |
| SW2 | 33 | There is a loss of operation, or the device turns off. | B |
| NC | 34 | There is no effect to the device. The device operates normal. | D |
| DRV1 | 35 | When the DRV1 pin is used: There is no output voltage to the load | B |
| When the DRV1 pin is not used: There is no effect to the device. | D | ||
| BIAS | 36 | The efficiency of the device is potentially reduced, or there is a thermal shutdown. | C |
| EN/UVLO | 37 | The device turns on or off unpredictably. | B |
| nRST | 38 | The device turns on or off unpredictably. | B |
| NC | 39 | There is no effect to the device. The device operates normal. | D |
| VIN | 40 | The device is not supplied. The device does not start-up. | B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| VCC1 | 1 | SS/ATRK (2) | When the VCC1 pin is enabled: There is no functionality of SS/ATRK. | C |
| When the VCC1 pin is disabled and tied to GND: The output is regulated to 0V. | B | |||
| When the VCC1 pin is disabled and tied to the VCC2 pin: There is no functionality of SS/ATRK. | C | |||
| SS/ATRK | 2 | SYNC (3) | When the SYNC pin is connected to GND: The device does not start-up. | B |
| When the SYNC pin is connected to the VCC2 pin: There is no functionality of SS/ATRK. | C | |||
| When the SYNC pin is driven from external signal: Functionality is erratic. | B | |||
| When the SYNC pin is configured as output: The output voltage is modulating with the SYNC signal. | B | |||
| SYNC | 3 | DTRK (4) | When the SYNC and DTRK pins are connected to the same signal: There is no effect to the device. | D |
| When the SYNC or DTRK pins are driven from an external signal: The output voltage and frequency are modulated with the external signal. | B | |||
| When the SYNC pin is configured as output: The output voltage of the converter is at 50% due to the DTRK functionality. | B | |||
| DTRK | 4 | SDA (5) | The output voltage is potentially modulated with the I2C communication or no I2C communication possible. | B |
| SDA | 5 | SCL (6) | No I2C communication possible, so the device does not start-up. | B |
| SCL | 6 | MODE (7) | No I2C communication possible, so the device does not start-up. | B |
| MODE | 7 | CFG2 (8) | When nRST rises: Configuration 1 or 16 are selected depending on the voltage at MODE pin. | B |
| The short is applied after start-up: The PFM or FPWM selection is unclear. | B | |||
| When one pin is connected to VCC2, and the other pin is connected to GND: The device does not start. | B | |||
| CFG2 | 8 | ADDR(CFG1) (9) | The setting of the ADDR(CFG1) pin defines if the device is operating in configuration 1 or 16, see the datasheet. | B |
| When the short is applied after start-up: There is no effect to the device. | D | |||
| When one pin is connected to the VCC2 pin, and the other pin is connected to GND: The device does not start. | B | |||
| ADDR(CFG1) | 9 | CDC (10) | When ADDR(CFG1) is connected to GND, see the pin to GND short table. | B |
| D | ||||
| When ADDR(CFG1) is connected to VCC2 and the CDC pin is configured as current monitor: The system gets a current signal indicated that is at the highest possible level independent of the real value measured. | B | |||
| When ADDR(CFG1) is connected to VCC2 and the CDC pin is configured as cable drop compensation: The maximum offset on the output is undefined and independent of the load current. | B | |||
| When ADDR(CFG1) is connected to VCC2 and the CDC pin is disabled (and connected to GND), see the pin to GND short table. | C | |||
| D | ||||
| CDC | 10 | nFLT/nINT (11) | If a pullup is connected to the nFLT/nINT pin and the CDC pin is configured as cable drop compensation: The output voltage is somewhat higher than set by the measured output current. | C |
| If a pullup is connected to the nFLT/nINT pin and the CDC pin is configured as current monitor: The system gets a current signal indication that is higher than the measured output current. | C | |||
| If the CDC pin is disabled (and connected to GND), the nFLT/nINT permanently indicates a fault. | B | |||
| nFLT/nINT | 11 | RT (12) | If a pullup is connected to the nFLT/nINT pin: The switching frequency decreases. | C |
| Whenever the nFLT/nINT pin is pulled low, the converter operates at maximum switching frequency and is potentially unstable. | B | |||
| RT | 12 | COMP (13) | The switching frequency is unstable. The voltage loop is potentially unstable. | B |
| COMP | 13 | FB/SEL_intFB (14) | When there is an external FB divider: The operation is erratic. | B |
| When there is an internal FB divider, and the pin is connected to the VCC2 pin: The operation is in current limit until OVP is triggered. | B | |||
| FB/SEL_intFB | 14 | AGND (15) | See the pin to GND short table. | B |
| AGND | 15 | ILIMCOMP (16) | See the pin to GND short table. | B |
| C | ||||
| ILIMCOMP | 16 | AGND (17) | See the pin to GND short table. | B |
| C | ||||
| AGND | 17 | VOUT (18) | The converter operates in peak or average current limit and the output voltage is shorted to GND. | B |
| VOUT | 18 | ISNSN (19) | When the ISNSN pin is connected to GND: The device operates in peak or average current limit and the output voltage is shorted to GND. | B |
| With input sensing: The differential voltage on the ISNSx pin is potentially too high. | A | |||
| With output sensing: The average current limit (sense line shorted) is potentially inaccurate. | C | |||
| ISNSN | 19 | ISNSP (20) | There is no average current limit function. | B |
| ISNSP | 20 | CSB (21) | The differential voltage on the sense amplifier is too high. Potential damage to one of the pins. | A |
| CSB | 21 | CSA (22) | There is no peak current limit function. | B |
| CSA | 22 | SW1 (23) | The peak current limit (sense line shorted) is potentially inaccurate. | C |
| SW1 | 23 | HO1 (24) | The device is in standby (BOOT_UV). | B |
| HO1 | 24 | HB1 (25) | The device is in standby (BOOT_UV). | B |
| HB1 | 25 | NC (26) | There is no effect to the device. The device operates normal. | D |
| NC | 26 | LO1 (27) | There is no effect to the device. The device operates normal. | D |
| LO1 | 27 | PGND (28) | The operation is non-synchronous in buck-mode and partially in buck-boost mode. Potential damage to the external FET due to power dissipation. | C |
| PGND | 28 | VCC2 (29) | The device does not start. | B |
| VCC2 | 29 | LO2 (30) | The device is in standby or shuts down. (The VCC2 pin is pulled to ground when the LO2 pin is pulled low.) | B |
| LO2 | 30 | HB2 (31) | At start-up the device stays in standby (BOOT_UV). | B |
| After start-up potential damage due to overvoltage on pin LO2. | A | |||
| HB2 | 31 | HO2 (32) | The device is in standby (BOOT_UV). | B |
| HO2 | 32 | SW2 (33) | The device is in standby (BOOT_UV). | B |
| SW2 | 33 | NC (34) | There is no effect to the device. The device operates normally. | D |
| NC | 34 | DRV1 (35) | There is no effect to the device. The device operates normally. | D |
| DRV1 | 35 | BIAS (36) | The external disconnect FET is potentially damaged. | A |
| BIAS | 36 | EN/UVLO (37) | There is a loss of the control of the EN/UVLO pin, and the device is in standby or the device is on. | B |
| EN/UVLO | 37 | nRST (38) | There is a loss of the control of the EN/UVLO pin, and the device is in standby or the device is on. | C |
| nRST | 38 | NC (39) | There is no effect to the device. The device operates normal. | D |
| NC | 39 | VIN (40) | There is no effect to the device. The device operates normal. | D |
| VIN | 40 | VCC1 (1) | There is device damage due to high voltage on pin VCC1. | A |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | There is device damage due to high voltage. | A |
| SS/ATRK | 2 | There is device damage due to high voltage. | A |
| SYNC | 3 | There is device damage due to high voltage. | A |
| DTRK | 4 | There is device damage due to high voltage. | A |
| SDA | 5 | There is device damage due to high voltage. | A |
| SCL | 6 | There is device damage due to high voltage. | A |
| MODE | 7 | There is device damage due to high voltage. | A |
| CFG2 | 8 | There is device damage due to high voltage. | A |
| ADDR(CFG1) | 9 | There is device damage due to high voltage. | A |
| CDC | 10 | There is device damage due to high voltage. | A |
| nFLT/nINT | 11 | There is device damage due to high voltage. | A |
| RT | 12 | There is device damage due to high voltage. | A |
| COMP | 13 | There is device damage due to high voltage. | A |
| FB/SEL_intFB | 14 | There is device damage due to high voltage. | A |
| AGND | 15 | There is device damage due to high voltage to PGND. | A |
| ILIMCOMP | 16 | There is device damage due to high voltage. | A |
| AGND | 17 | There is device damage due to high voltage to PGND. | A |
| VOUT | 18 | The converter is bypassed. | B |
| ISNSN | 19 | With input sensing: There is no average current limit. | B |
| With output sensing: The differential voltage between the ISNSP and ISNSN pins is potentially too high. | A | ||
| ISNSP | 20 | With input sensing: The input sensing (sense line shorted) is inaccurate. | C |
| With output sensing: The differential voltage between the ISNSP and ISNSN pins is potentially too high. | A | ||
| CSB | 21 | The buck high-side FET is bypassed. The operation is erratic. There is potentially damage to the device due to high differential voltage between the CSA and CSB pins. | A |
| CSA | 22 | The buck high-side FET is bypassed. The operation is erratic. There is potentially damage to the device due to high differential voltage between the CSA and CSB pins. | A |
| SW1 | 23 | The buck high-side FET is bypassed. The operation is erratic. | B |
| HO1 | 24 | There is device damage due to high voltage. | A |
| HB1 | 25 | There is device damage due to high voltage. | A |
| NC | 26 | There is no effect to the device. The device operates normal. | D |
| LO1 | 27 | There is device damage due to high voltage. | A |
| PGND | 28 | There is device damage due to high voltage to AGND. | A |
| VCC2 | 29 | There is device damage due to high voltage. | A |
| LO2 | 30 | There is device damage due to high voltage. | A |
| HB2 | 31 | There is device damage due to high voltage. | A |
| HO2 | 32 | There is device damage due to high voltage. | A |
| SW2 | 33 | The boost low-side FET is potentially damaged. | B |
| NC | 34 | There is no effect to the device. The device operates normal. | D |
| DRV1 | 35 | The external disconnect FET is potentially damaged. | B |
| BIAS | 36 | When the BIAS pin is connected to the VOUT pin: VIN and VOUT are shorted. | B |
| When the BIAS pin is connected to VIN: There is no effect to the device. | D | ||
| EN/UVLO | 37 | There is no UVLO function. The nRST pin defines standby and enable. | D |
| nRST | 38 | The nRST pin is always enabled. | D |
| NC | 39 | There is no effect to the device. The device operates normal. | D |
| VIN | 40 | There is no effect to the device. The device operates normal. | D |