SFFSBP7 November 2026 TPS1HTC100-Q1

4 Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of the TPS1HTC100-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:

Pin short-circuited to ground (see Table 4-2)
Pin open-circuited (see Table 4-3)
Pin short-circuited to an adjacent pin (see Table 4-4)
Pin short-circuited to supply (see Table 4-5)

Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Table 4-1 TI Classification of Failure Effects

Class	Failure Effects
A	Potential device damage that affects functionality.
B	No device damage, but loss of functionality.
C	No device damage, but performance degradation.
D	No device damage, no impact to functionality or performance.

Figure 4-1 shows the TPS1HTC100-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TPS1HTC100-Q1 datasheet.

Figure 4-1 Pin Diagram

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

The user follows the datasheet recommendations for operating conditions, external components selection, and PCB layout.

Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground

Pin Name	Pin No.	Description of Potential Failure Effects	Failure Effect Class
GND	1	The resistor diode network is bypassed if present.	B
EN	2	There is a shutdown of the output.	B
DIAG_EN	3	The diagnostics are disabled.	B
FAULT	4	The reported status can be erroneous.	B
LATCH	5	The device defaults to auto-retry (automatic) mode when encountering a thermal fault.	B
SNS	6	The sense current is not valid from the SNS pin.	B
ILIM	7	The device defaults to the internal current limit.	C
NC	11	There is no effect on the device.	D
VOUT	8, 9, 10	The current limit of the device engages.	B
VS	12, 13, 14	The device has no input supply, and therefore, does not function.	B

Table 4-3 Pin FMA for Device Pins Open-Circuited

Pin Name	Pin No.	Description of Potential Failure Effects	Failure Effect Class
GND	1	Loss of ground detection engages, and the device shuts off.	B
EN	2	The output is shutdown, and the EN pin is pulled down internally.	B
DIAG_EN	3	DIAG_EN is internally pulled down. The diagnostics are disabled.	B
FAULT	4	The fault signal is not reported.	B
LATCH	13	LATCH is internally pulled down. The device defaults to auto-retry mode when encountering a thermal fault.	B
SNS	10	The correct sense current cannot be read.	B
ILIM	11	The device defaults to the internal current limit.	C
NC	11	There is no effect on the device.	D
VOUT	8, 9, 10	There is no effect on the device. If configured, open load detection triggers.	B
VS	12, 13, 14	The device has no input supply, and therefore, does not function.	B

Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin

Pin Name	Pin No.	Shorted to	Description of Potential Failure Effects	Failure Effect Class
GND	1	EN	The channel is disabled.	B
EN	2	DIAG_EN	The EN signal effects the DIAG_EN signal and vice versa.	B
DIAG_EN	3	FAULT	Fault reporting is erroneous. The diagnostics are enabled if FAULT is pulled high.	B
FAULT	4	LATCH	Fault reporting is erroneous. The device is in auto-retry mode if FAULT is pulled high.	B
LATCH	5	SNS	The current sensing output is erroneous. The device is in auto-retry or latched off depending on the output of the SNS pin.	B
SNS	6	ILIM	The current limit and current sensing output are incorrect.	B
VOUT	10	NC	There is no effect on the device.	D
NC	11	VS	There is no effect on the device.	D

Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply (VS)

Pin Name	Pin No.	Description of Potential Failure Effects	Failure Effect Class
GND	1	The supply power is bypassed, and the device does not turn on.	B
EN	2	There is a potential violation of the absolute maximum rating of pin, and a possible breakdown of the ESD cell.	A
DIAG_EN	3	There is a potential violation of the absolute maximum rating of pin, and a possible breakdown of the ESD cell.	A
FAULT	4	There is a potential violation of the absolute maximum rating of pin, and a possible breakdown of the ESD cell..	A
LATCH	5	There is a potential violation of the absolute maximum rating of pin, and a possible breakdown of the ESD cell.	A
SNS	6	There is a potential violation of the absolute maximum rating of pin, and a possible breakdown of the ESD cell.	A
ILIM	7	There is a potential violation of the absolute maximum rating of pin, and a possible breakdown of the ESD cell.	A
NC	11	There is no effect on the device.	D
VOUT	8, 9, 10	The output is pulled to the supply voltage. Short-to-battery detection is triggered if configured.	B