7 Revision History
Changes from Revision G (January 2005) to Revision H (September 2026)
- Deleted Internal frequency compensation from Features sectionGo
- Added Applications sectionGo
- Updated ordering information table
from old to new formatGo
- Deleted sample schematic
diagramGo
- Updated Absolute Maximum RatingsGo
- Added ESD Ratings sectionGo
- Added Thermal Information sectionGo
- Changed Input offset voltage TYP value from 2mV to ±0.3mV and test
conditionsGo
- Changed Temperature coefficient of input offset voltage TYP value
from 10µV/°C to 0.6µV/°C and deleted test conditionsGo
- Changed Input offset current TYP value from ±30nA to ±0.005nA and
deleted test conditions and deleted Full range rowGo
- Deleted Temperature coefficient of input offset
currentGo
- Changed Input bias current from –200nA to ±0.01nA and deleted test
conditions and deleted Full range rowGo
- Changed Common-mode input voltage range MIN value from
VCC- to 13 to (V-) to 13 and TYP value from VCC- to
13.5 to (V-) - 0.2 to (V+) + 0.2Go
- Changed Peak output-voltage swing typical voltage for RL=
10kΩ from ±13.5V to ±14.95V and for RL= 2kΩ from ±13V to
±14.8VGo
- Changed Large-signal differential voltage amplification at 25°C
minimum value from 20V/mV to 86V/mV and typical value from 200V/mV to 145V/mV. Go
- Changed Large-signal differential voltage amplification at Full
range minimum value from 15V/mV to 83V/mV Go
- Changed Maximum-output-swing bandwidth typical value from 9kHz to
40kHz and test condition of RL = 2kΩ to RL =
10kΩGo
- Changed Phase margin test condition from CL = 200pF to
CL = 80pFGo
- Changed Input resistance typical value from 1MΩ to 540GΩ and deleted
Min and Max values and test conditionGo
- Changed Output resistance typical value from 75Ω to 575Ω and changed
test condition from f = 20Hz to f = 1MHzGo
- Changed Common-mode rejection ratio typical value from 90dB to
115dBGo
- Changed Supply-voltage sensitivity typical value from 30μV/V to
0.75μV/VGo
- Changed Short-circuit output current TYP value from 30mA to
80mAGo
- Deleted Short-circuit output current MAX valueGo
- Changed Total supply current TYP value from 0.7mA to 0.13mA and
changed test conditionsGo
- Deleted Electrical Characteristics table notesGo
- Changed Input offset voltage typical value from 2mV to
0.3mVGo
- Changed Input offset current typical value from 30nA to
0.005nAGo
- Changed Input bias current typical value from -200nA to
0.01nAGo
- Changed Peak output voltage swing typical value from 3.5V to
4.8VGo
- Changed Large-signal differential voltage amplification minimum
value from 20V/mV to 86db and typical value from 200V/mV to
118dbGo
- Changed Supply current typical value from 0.7mA to
0.13mAGo
- Changed Slew rate at unity gain typical value from 1V/µs to 4.5V/µs
and updated test conditionsGo
- Changed Rise time to Settling time and typical value from 0.35µs to
2µs and updated test conditionsGo
- Deleted Fall timeGo
- Deleted Overshoot factorGo
- Changed Crossover distortion to Total Harmonic Distortion + Noise
and typical value from 1% to 0.002% and updated test conditionsGo
- Deleted Parameter Measurement Information sectionGo
- Updated Typical Characteristics section as per New Die
characteristicsGo
- Added Old vs New Die Comparison topicGo