SLVK172 June   2024 TPS7H3014-SP

 

  1.   1
  2.   TPS7H3014-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-Up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

Abstract

The purpose of this study is to characterize the Single-Event Effects (SEE) performance due to heavy-ion irradiation of the TPS7H3014-SP. Heavy-ions with LETEFF of 75MeV·cm2/mg were used to irradiate production devices. Flux of ≈8 × 104 ions/cm2·s and fluence of ≈107 ions/cm2 per run were used for the characterization. The results demonstrate the TPS7H3014-SP is SEL-free and SEB/SEGR-free at T = 125°C and T = 25°C, respectively. The TPS7H3014-SP was also tested for SET at T = 25°C, results demonstrate the device is SET-free.