SLVS543S August   2004  – May 2024 TL431 , TL431C , TL432

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison Table
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Thermal Information
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Electrical Characteristics, TL431C, TL432C
    6. 6.6  Electrical Characteristics, TL431I, TL432I
    7. 6.7  Electrical Characteristics, TL431Q, TL432Q
    8. 6.8  Electrical Characteristics, TL431AC, TL432AC
    9. 6.9  Electrical Characteristics, TL431AI, TL432AI
    10. 6.10 Electrical Characteristics, TL431AQ, TL432AQ
    11. 6.11 Electrical Characteristics, TL431BC, TL432BC
    12. 6.12 Electrical Characteristics, TL431BI, TL432BI
    13. 6.13 Electrical Characteristics, TL431BQ, TL432BQ
    14. 6.14 Typical Characteristics
  8. 7 Parameter Measurement Information
    1. 7.1 Temperature Coefficient
    2. 7.2 Dynamic Impedance
  9. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
      1. 8.4.1 Open Loop (Comparator)
      2. 8.4.2 Closed Loop
  10. 9 Applications and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Comparator With Integrated Reference
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Basic Operation
            1. 9.2.1.2.1.1 Overdrive
          2. 9.2.1.2.2 Output Voltage and Logic Input Level
            1. 9.2.1.2.2.1 Input Resistance
        3. 9.2.1.3 Application Curve
      2. 9.2.2 Shunt Regulator/Reference
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
          1. 9.2.2.2.1 Programming Output/Cathode Voltage
          2. 9.2.2.2.2 Total Accuracy
          3. 9.2.2.2.3 Stability
          4. 9.2.2.2.4 Start-Up Time
        3. 9.2.2.3 Application Curve
    3. 9.3 System Examples
    4. 9.4 Power Supply Recommendations
    5. 9.5 Layout
      1. 9.5.1 Layout Guidelines
      2. 9.5.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Device Nomenclature
    2. 10.2 Related Links
    3. 10.3 Receiving Notification of Documentation Updates
    4. 10.4 Support Resources
    5. 10.5 Trademarks
    6. 10.6 Electrostatic Discharge Caution
    7. 10.7 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information

6.14 Typical Characteristics

Data at high and low temperatures are applicable only within the recommended operating free-air temperature ranges of the various devices.

TL431 TL432 Reference Voltage vs Free-Air TemperatureFigure 6-1 Reference Voltage vs Free-Air Temperature
TL431 TL432 Cathode Current vs Cathode VoltageFigure 6-3 Cathode Current vs Cathode Voltage
TL431 TL432 Off-State Cathode Current vs Free-Air TemperatureFigure 6-5 Off-State Cathode Current vs Free-Air Temperature
TL431 TL432 Equivalent Input Noise Voltage vs FrequencyFigure 6-7 Equivalent Input Noise Voltage vs Frequency
TL431 TL432 Reference Current vs Free-Air TemperatureFigure 6-2 Reference Current vs Free-Air Temperature
TL431 TL432 Cathode Current vs Cathode VoltageFigure 6-4 Cathode Current vs Cathode Voltage
TL431 TL432 Ratio of Delta Reference Voltage to Delta Cathode Voltage vs Free-Air TemperatureFigure 6-6 Ratio of Delta Reference Voltage to Delta Cathode Voltage vs Free-Air Temperature
TL431 TL432 Equivalent Input Noise Voltage Over a 10S PeriodFigure 6-8 Equivalent Input Noise Voltage Over a 10S Period
TL431 TL432 Test Circuit for Equivalent Input Noise Voltage Over a 10S PeriodFigure 6-9 Test Circuit for Equivalent Input Noise Voltage Over a 10S Period
TL431 TL432 Small-Signal Voltage Amplification vs FrequencyFigure 6-10 Small-Signal Voltage Amplification vs Frequency
TL431 TL432 Reference Impedance vs FrequencyFigure 6-12 Reference Impedance vs Frequency
TL431 TL432 Pulse ResponseFigure 6-14 Pulse Response
TL431 TL432 Stability Boundary Conditions for All TL431 and TL431A Devices (Except for SOT23-3, SC-70, and Q-Temp Devices)

The areas under the curves represent conditions that can cause the device to oscillate. For curves B, C, and D, R2 and V+ are adjusted to establish the initial VKA and IKA conditions, with CL = 0. VBATT and CL then are adjusted to determine the ranges of stability.
Figure 6-16 Stability Boundary Conditions for All TL431 and TL431A Devices (Except for SOT23-3, SC-70, and Q-Temp Devices)
TL431 TL432 Stability Boundary Conditions for All TL431B, TL432, SOT-23, SC-70, and Q-Temp Devices

The areas under the curves represent conditions that can cause the device to oscillate. For curves B, C, and D, R2 and V+ are adjusted to establish the initial VKA and IKA conditions, with CL = 0. VBATT and CL then are adjusted to determine the ranges of stability.
Figure 6-18 Stability Boundary Conditions for All TL431B, TL432, SOT-23, SC-70, and Q-Temp Devices
TL431 TL432 Test Circuit for Voltage AmplificationFigure 6-11 Test Circuit for Voltage Amplification
TL431 TL432 Test Circuit for Reference ImpedanceFigure 6-13 Test Circuit for Reference Impedance
TL431 TL432 Test Circuit for Pulse ResponseFigure 6-15 Test Circuit for Pulse Response
TL431 TL432 Test Circuits for Stability Boundary ConditionsFigure 6-17 Test Circuits for Stability Boundary Conditions
TL431 TL432 Test Circuit for Stability Boundary ConditionsFigure 6-19 Test Circuit for Stability Boundary Conditions