SNAK020 January   2024 LMX1906-SP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Test Method
  6. 3Results
  7. 4References
  8.   A RLAT Data and Plots

Abstract

LMX1906-SP (5962R2320201PXE) wafer lot 2013693 was put through radiation lot acceptance testing (RLAT) and passed at 100 krad(Si). The wafer fab process used by this product was previously shown not to exhibit Enhanced Low Dose Rate Sensitivity (ELDRS) and is ELDRS-free.