SNOAA62A February   2023  – February 2023 LMP7704-SP

 

  1.   Abstract
  2.   Trademarks
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5SEL Results
  8. 6SET Results
  9. 7Summary
  10.   A Confidence Interval Calculations
  11.   B References
  12.   C Revision History

SET Results

The LMP7704-SP was characterized for SETs from 2 to 85 MeV-cm2/mg. Table 6-2 lists the ions used for the testing.The device was tested at room temperature in a buffer configuration with the four different setups show in Table 6-1. A flux of 104 ions/s-cm2 was used for all SET runs. The SETs discussed in this report were defined as output voltages that exceeded a window trigger of 5% from the expected output. Both positive and negative upsets were observed during the testing.

Table 6-1 DUT Configurations
Configuration Gain Power Supply (±V) Input (V) Expected Output (V) Trigger Window (V)

1

1

1.35

1

1

0.95–1.05

2

6

2

2

1.9–2.1

3

10

1.35

0.1

1

0.95–1.05

4

6

0.2

2

1.9–2.1

Table 6-2 Ions and Incident Angles
LETEFF (MeV-cm2/mg) Ion Angle (Degree)

85

Ho

25.5

75

Ho

0

72

Pr

25.5

65

Pr

0

54

Ag

25.5

48

Ag

0

23

Cu

25.5

9

Ar

0

2

Ne

0

The number of events observed during the heavy ion runs are presented in Table 6-3 to Table 6-6. All four channels were monitored during the heavy ion runs. LMP7704-SP was tested to fluences ranging from 106 to 2 × 106 ions/cm2.

Table 6-3 SET Results: VS = ±1.35 V, Gain = 1

LETEFF

(MeV-cm2/mg)

Fluence

(ions/cm2)

Ch1

Ch2

Ch3

Ch4

# of Events

Cross Section (cm2)

# of Events Cross Section (cm2) # of Events Cross Section (cm2) # of Events Cross Section (cm2)

85

9.96E+05

28

2.81E-05

252

2.53E-04

248

2.49E-04

45

4.52E-05

75

1.00E+06

20

2.00E-05

248

2.48E-04

194

1.94E-04

40

4.00E-05

72

1.01E+06

23

2.29E-05

17

1.69E-05

4

3.98E-06

4

3.98E-06

65

9.70E+05

18

1.86E-05

13

1.34E-05

6

6.19E-06

20

2.06E-05

54

2.00E+06

20

1.00E-05

17

8.52E-06

7

3.51E-06

26

1.30E-05

48

1.99E+06

16

8.04E-06

14

7.04E-06

10

5.03E-06

17

8.54E-06

23

2.00E+06

0

0.00E+00

0

0.00E+00

0

0.00E+00

1

4.99E-07

9

1.99E+06

1

5.03E-07

0

0.00E+00

0

0.00E+00

1

5.03E-07

2

2.00E+06

1

5.00E-07

0

0.00E+00

0

0.00E+00

2

1.00E-06

Table 6-4 SET Results: VS = ±6 V, Gain = 1

LETEFF

(MeV-cm2/mg)

Fluence

(ions/cm2)

Ch1

Ch2

Ch3

Ch4

# of Events Cross Section (cm2) # of Events Cross Section (cm2) # of Events Cross Section (cm2) # of Events Cross Section (cm2)

85

1.00E+06

14

1.40E-06

67

6.70E-05

41

4.10E-05

28

2.80E-05

75

1.00E+06

16

1.60E-06

53

5.30E-05

59

5.90E-05

11

1.10E-05

72

1.00E+06

14

1.40E-06

15

1.50E-05

10

9.97E-06

13

1.30E-05

65

9.80E+05

13

1.33E-05

11

1.12E-05

20

2.04E-05

12

1.22E-05

54

2.00E+06

21

1.05E-05

17

8.50E-06

16

8.00E-06

18

9.00E-06

48

2.00E+06

21

1.05E-05

24

1.20E-05

10

5.00E-06

18

9.00E-06

23

2.00E+06

2

1.00E-06

0

0.00E+00

0

0.00E+00

6

3.01E-06

9

1.99E+06

0

0.00E+00

0

0.00E+00

0

0.00E+00

0

0.00E+00

2

1.99E+06

0

0.00E+00

0

0.00E+00

0

0.00E+00

0

0.00E+00

Table 6-5 SET Results: VS = ±1.35 V, Gain = 10

LETEFF

(MeV-cm2/mg)

Fluence

(ions/cm2)

Ch1

Ch2

Ch3

Ch4

# of Events

Cross Section (cm2)

# of Events Cross Section (cm2) # of Events Cross Section (cm2) # of Events Cross Section (cm2)

85

1.01E+06

253

2.50E-04

214

2.12E-04

187

1.85E-04

288

2.85E-04

75

9.99E+05

175

1.75E-04

200

2.00E-04

145

1.45E-04

211

2.11E-04

72

9.68E+05

153

1.58E-04

154

1.59E-04

113

1.17E-04

209

2.16E-04

65

1.00E+06

101

1.01E-04

95

9.50E-05

72

7.20E-05

163

1.63E-04

54

2.00E+06

74

3.70E-05

81

4.05E-05

45

2.25E-05

124

6.20E-05

48

2.00E+06

61

3.06E-05

53

2.66E-05

32

1.60E-05

100

5.01E-05

23

2.00E+06

8

4.00E-06

15

7.50E-06

1

5.00E-07

21

1.05E-05

9

1.99E+06

0

0.00E+00

0

0.00E+00

0

0.00E+00

2

1.01E-06

2

1.99E+06

0

00.00E+00

0

0.00E+00

0

0.00E+00

0

0.00E+00

Table 6-6 SET Results: VS = ±6 V, Gain = 10

LETEFF

(MeV-cm2/mg)

Fluence

(ions/cm2)

Ch1

Ch2

Ch3

Ch4

# of Events

Cross Section (cm2)

# of Events Cross Section (cm2) # of Events Cross Section (cm2) # of Events Cross Section (cm2)

85

1.03E+06

22

2.14E-05

32

3.11E-05

20

1.94E-05

38

3.69E-05

75

9.97E+05

27

2.71E-05

20

2.01E-05

27

2.71E-05

34

3.41E-05

72

1.20E+06

22

1.83E-05

19

1.58E-05

24

1.99E-05

35

2.91E-05

65

1.00E+06

19

1.90E-05

14

1.40E-05

27

2.70E-05

30

3.00E-05

54

2.00E+06

31

1.55E-05

19

9.51E-06

38

1.90E-05

65

3.25E-05

48

2.00E+06

27

1.35E-05

19

9.50E-06

21

1.05E-05

27

1.35E-05

23

2.00E+06

2

1.00E-06

0

0.00E+00

1

5.00E-07

2

1.00E-06

9

2.00E+06

0

0.00E+00

0

0.00E+00

0

0.00E+00

2

1.00E-06

2

1.99E+06

0

0.00E+00

0

0.00E+00

0

0.00E+00

0

0.00E+00

#GUID-F4E45DC7-BF45-4FE7-A2B2-69668F2946C2 to #GUID-ED9A5E11-C632-47D5-8053-8DF374660B01 show the worst-case positive and negative transients at 85 MeV-cm2/mg for each test configuration. Importantly, no SETs were observed that reached the voltage supply levels.

When testing with VS = ±1.35 V, Gain = 1, the worst-case positive transient occurred on channel 2 and reached a peak value of 1.189 V. The event lasted 1.2 µs. The worst-case negative transient occurred on channel 1 and reached a peak value of 0.79 V. The event lasted 0.39 µs.

GUID-74EF9ECA-7265-4986-AA06-8DEDF6A2360E-low.pngFigure 6-1 Worst-Case Positive Transient on Run #4 With VS = ±1.35 V, Gain = 1
GUID-B903C961-9124-4729-ADC0-B7BBB9686B71-low.pngFigure 6-2 Worst-Case Negative Transient on Run #4 With VS = ±1.35 V, Gain = 1

When testing with VS = ±6 V, Gain = 1, the worst-case positive transient occurred on channel 2 and reached a peak value of 2.34 V. The event lasted 0.81 µs. The worst-case negative transient occurred on channel 4 and reached a peak value of 1.62 V. The event lasted 0.39 µs.

GUID-A45A3E42-ED25-4040-B5BE-8308B46AC8C3-low.pngFigure 6-3 Worst-Case Positive Transient on Run #3 With VS = ±6 V, Gain = 1
GUID-85D0FE89-A489-43F6-BACC-57367E386B18-low.pngFigure 6-4 Worst-Case Negative Transient on Run #3 With VS = ±6 V, Gain = 1

When testing with VS = ±1.35 V, Gain = 10, the worst-case positive transient occurred on channel 3 and reached a peak value of 1.2 V. The event lasted 1.44 µs. The worst-case negative transient occurred on channel 4 and reached a peak value of 0.72 V. The event lasted 1.43 µs.

GUID-5646157F-9F71-4734-B433-07617545DFCE-low.pngFigure 6-5 Worst-Case Positive Transient on Run #5 With VS = ±1.35 V, Gain = 10
GUID-13785754-A052-4791-A176-BEC443BE7DAA-low.pngFigure 6-6 Worst-Case Negative Transient on Run #5 With VS = ±1.35 V, Gain = 10

When testing with VS = ±6 V, Gain = 10, the worst-case positive transient occurred on channel 4 and reached a peak value of 2.56 V. The event lasted 0.32 µs. The worst-case negative transient occurred on channel 1 and reached a peak value of 1.7 V. The event lasted 2 µs.

GUID-228C5D61-505C-4450-909E-9E2AB8D57CEA-low.pngFigure 6-7 Worst-Case Positive Transient on Run #6 With VS = ±6 V, Gain = 10
GUID-1EE8622A-C5D9-4E4C-A56B-A13A81E68FBA-low.pngFigure 6-8 Worst-Case Negative Transient on Run #6 With VS = ±6 V, Gain = 10
GUID-8A992C11-21B9-4925-B8C6-F685845060BD-low.png Figure 6-9 Histogram of the Transient Recovery Time for Each Upset at Supply Voltages of ±1.35 V and a Gain of 1
GUID-9D7ACD4C-BA62-4D40-BE1D-FB9272889B26-low.png Figure 6-10 Histogram of the Transient Recovery Time for Each Upset at Supply Voltages of ±6 V and a Gain of 1
GUID-EBF41A7D-7391-4306-858E-A26D93691A1B-low.png Figure 6-11 Histogram of the Transient Recovery Time for Each Upset at Supply Voltages of ±1.35 V and a Gain of 10
GUID-CBF6422B-EE62-4E96-B97C-4F1CFA445220-low.png Figure 6-12 Histogram of the Transient Recovery Time for Each Upset at Supply Voltages of ±6 V and a Gain of 10

#GUID-21157412-D42B-42AB-BCD9-812107488DCB through #GUID-55A5C888-D65C-4EAB-9EA1-3CEB67C16879 show the plots of the SET cross section versus LET for the different operating modes used during SET testing for each channel. At low LETs, a very low number of transient events (≤ 2) occurred, resulting in different onsets from channel to channel. This causes the cross section plots to look different for each channel.

GUID-E5B5D8AD-05D7-4190-9BCB-D8662884BE06-low.pngFigure 6-13 Weibull Plot: VS ±1.35 V and Gain = 1 - Channel 1
GUID-3D06198A-1E1E-4D83-A780-3FB913AFB043-low.pngFigure 6-15 Weibull Plot: VS ±1.35 V and Gain = 1 - Channel 3
GUID-8EC12227-7F3E-4F2A-8AB4-CF6BC10E367D-low.pngFigure 6-17 Weibull Plot: VS ±6 V and Gain = 1 - Channel 1
GUID-49532AE4-C796-40DE-B626-BD3D418395F6-low.pngFigure 6-19 Weibull Plot: VS ±6 V and Gain = 1 - Channel 3
GUID-F31A02C6-0B5B-456A-9ADE-4E1DD64FC76A-low.pngFigure 6-21 Weibull Plot: VS ±1.35 V and Gain = 10 - Channel 1
GUID-E591B5DB-B58C-4D98-A09D-6BE2B0FB85BD-low.pngFigure 6-23 Weibull Plot: VS ±1.35 V and Gain = 10 - Channel 3
GUID-7B886F87-F79E-4F27-A0D4-62F9BFF79253-low.pngFigure 6-25 Weibull Plot: VS ±6 V and Gain = 10 - Channel 1
GUID-C930842D-68EA-4AE8-94F0-AF766F9E8279-low.pngFigure 6-27 Weibull Plot: VS ±6 V and Gain = 10 - Channel 3
GUID-53AD2B5E-511D-4D96-A6F9-58E0ADC7AA85-low.pngFigure 6-14 Weibull Plot: VS ±1.35 V and Gain = 1 - Channel 2
GUID-252E96B4-5911-4C43-B902-DB970ECC5077-low.pngFigure 6-16 Weibull Plot: VS ±1.35 V and Gain = 1 - Channel 4
GUID-0F5AAD3D-E937-426B-8BD3-F4BC5C4CD202-low.pngFigure 6-18 Weibull Plot: VS ±6 V and Gain = 1 - Channel 2
GUID-F78ACEED-B3D2-4ABB-88F8-2159C7A340CF-low.pngFigure 6-20 Weibull Plot: VS ±6 V and Gain = 1 - Channel 4
GUID-4F68E209-4180-4533-B1DE-2AA10B8696C6-low.pngFigure 6-22 Weibull Plot: VS ±1.35 V and Gain = 10 - Channel 2
GUID-FBF7DCA5-3C43-48B2-85CC-80333D90A4F2-low.pngFigure 6-24 Weibull Plot: VS ±1.35 V and Gain = 10 - Channel 4
GUID-B3A9588E-8D56-45A2-95F3-900515483BDA-low.pngFigure 6-26 Weibull Plot: VS ±6 V and Gain = 10 - Channel 2
GUID-C1FF32AF-4FE7-4531-8D58-FC69F8B21433-low.pngFigure 6-28 Weibull Plot: VS ±6 V and Gain = 10 - Channel 4