SNVA919A January   2020  – July 2020 LM25180 , LM25180-Q1 , LM5180 , LM5180-Q1 , LM5181 , LM5181-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. 5Revision History

1 Overview

This document contains information for LM5180, LM5180-Q1, LM25180, LM25180-Q1, LM5181, and LM5181-Q1 (WSON package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-20200701-SS0I-CDNG-89ZT-JZ5DXRXDHS0P-low.gifFigure 1-1 Functional Block Diagram

LM5180, LM5180-Q1, LM25180, LM25180-Q1, LM5181, and LM5181-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.