SSZT340 february   2020 TPS50601A-SP , TPS7A4501-SP , TPS7H1101A-SP , TPS7H2201-SP , TPS7H2211-SP


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    2. 1. Higher power density in satellite payloads.
    3. 2. Increased integration of space FETs and smaller ceramic packages.
    4. 3. More satellites with radiation-hardened power.
    5. 4. The growth of in-depth radiation effects analysis and collateral.
    6.     Conclusion
    7.     Additional resources:

Sree Alvarado


Power architecture designs for space applications have historically lagged behind the commercial world due to the complexity of designing radiation-hardened integrated circuits (ICs). Today, the situation is changing rapidly. Developments in 5G technology are fueling the need for more bandwidth and global Internet coverage, pushing many countries to launch higher volumes of satellites into space, while increased functionality and protection demands are driving the need for specialized space-grade power ICs that come in small packages and offer greater integration. As designers opt for more complex ICs for their space-grade power-management projects, here are four key trends to keep your eye on.

4. The growth of in-depth radiation effects analysis and collateral.

The growth of more complex, integrated power ICs makes radiation testing, modeling and reporting even more important, and requires detailed evidence of an IC’s suitability for a space environment. Since the complexity of modern space-grade devices makes such analysis difficult, more designers will start to lean on suppliers for support, driving demand for detailed documentation for space-grade power-management devices, including radiation reports for TID, single-event effects (SEEs) and neutron displacement damage effects, as well as worst-case analysis (WCA) models. To answer this demand, more manufacturers will start providing full SEL, single-event upset (SEU), single-event transient (SET), single-event burnout (SEB) and single-event gate rupture (SEGR) characterization for devices, as well as worst-case analysis models, which include process-voltage-temperature variation, aging effects from life testing, TID effects, and support Monte Carlo analysis. WCA models are available today for the TPS7H1101A-SP low-dropout regulator (LDO), the TPS7A4501-SP LDO, and the TPS50601A-SP buck converter.