SWRZ154 August   2023 IWR1843AOP

 

  1.   1
  2. 1Introduction
  3. 2Device Nomenclature
  4. 3Device Markings
  5. 4Advisory to Silicon Variant / Revision Map
  6. 5Known Design Exceptions to Functional Specifications
    1.     MSS#03
    2.     MSS#04A
    3.     MSS#05A
    4.     MSS#13
    5.     MSS#17
    6.     MSS#18
    7.     MSS#19
    8.     MSS#20
    9.     MSS#21A
    10.     MSS#22
    11.     MSS#23
    12.     MSS#24
    13.     MSS#25
    14.     MSS#26
    15.     MSS#27
    16.     MSS#28
    17.     MSS#29
    18.     MSS#30
    19.     MSS#31
    20.     MSS#32
    21.     MSS#33
    22.     MSS#34
    23.     MSS#35
    24.     MSS#37B
    25.     MSS#38A
    26.     MSS#39
    27.     MSS#40
    28.     MSS#42
    29.     MSS#43A
    30.     MSS#44
    31.     MSS#45
    32.     ANA#08A
    33.     ANA#09A
    34.     ANA#10
    35.     ANA#11A
    36.     ANA#12A
    37.     ANA#13B
    38.     ANA#15
    39.     ANA#16
    40.     ANA#17A
    41.     ANA#18B
    42.     ANA#20
    43.     ANA#21B
    44.     ANA#22A
    45.     ANA#24A
    46.     ANA#27
    47.     PACKAGE#02A
  7. 6Trademarks
  8. 7Revision History

2 Device Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of Radar / mmWave sensor devices. Each of the Radar devices has one of the two prefixes: XIx or IWR1x (for example: IWR1843ARBGALP). These prefixes represent evolutionary stages of product development from engineering prototypes (XIx) through fully qualified production devices (IWR1x).

Device development evolutionary flow:

XIx — Experimental device that is not necessarily representative of the final device's electrical specifications and may not use production assembly flow.
IWR1x — Production version of the silicon die that is fully qualified.

X1x devices are shipped with the following disclaimer:

"Developmental product is intended for internal evaluation purposes."

Texas Instruments recommends that these devices not to be used in any production system as their expected end –use failure rate is still undefined.